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Failure Mode Investigation for Blue Polymer EL Device

Published online by Cambridge University Press:  01 February 2011

Mu-Gyeom Kim ,
Sang Yeol Kim ,
Tae Woo Lee ,
Sang Hun Park ,
Ju Cheol Park ,
Jong Jin Park  and
Lyong Sun Pu
Mu-Gyeom Kim
Affiliation:
[email protected], Samsung Advanced Institute of Technology, Display Lab., Mt.14-1, Nongseo-Dong, Giheung-Gu,, Yongin-Si, Gyeonggi-Do, 449-712, Korea, Republic of
Sang Yeol Kim
Affiliation:
[email protected], Samsung Advanced Institute of Technology, Yongin-Si, Gyeonggi-Do, 449-712, Korea, Republic of
Tae Woo Lee
Affiliation:
[email protected], Samsung Advanced Institute of Technology, Yongin-Si, Gyeonggi-Do, 449-712, Korea, Republic of
Sang Hun Park
Affiliation:
[email protected], Samsung Advanced Institute of Technology, Yongin-Si, Gyeonggi-Do, 449-712, Korea, Republic of
Ju Cheol Park
Affiliation:
[email protected], Samsung Advanced Institute of Technology, Yongin-Si, Gyeonggi-Do, 449-712, Korea, Republic of
Jong Jin Park
Affiliation:
[email protected], Samsung Advanced Institute of Technology, Yongin-Si, Gyeonggi-Do, 449-712, Korea, Republic of
Lyong Sun Pu
Affiliation:
[email protected], Samsung Advanced Institute of Technology, Yongin-Si, Gyeonggi-Do, 449-712, Korea, Republic of
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Abstract

We report the failure mode observed in polymer EL blue device. Such modes were analyzed by non-destructive and destructive ways. As a non-destructive way, investigation of mobility changes of hole and electron, measuring transient EL corresponding to life curve, had been done. We also observed compositional and morphological variation using TEM-EDX, STM, FT-IR, TOF-SIMS and reverse engineering method as a destructive way. Electron mobility has a higher dependency on life curve, which fact could be reflected on the formation of insoluble layer inside emitting layer on anode side. And such insoluble layer showed relatively ordered surface morphology, and might be a cross-linked layer through C-O-C bond cleavage process while EL operation. But, contrary to sulfur migration mechanism into insoluble layer insisted by CDT, we did confirm no obvious difference of sulfur composition between insoluble and emitting layers. Rather, there's some degree of Ba diffusion into emitting layer from decomposition of BaF2, but, which dose not have a major effect on device degradation.

Keywords

organicpolymerdevices
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 937: Symposium M – Conjugated Organic Materials – Synthesis, Structure, Device, and Applications , 2006 , 0937-M07-40
Copyright
Copyright © Materials Research Society 2006

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