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Fabrication of Anatase TiO2 Thin Film Using Pulsed DC Magnetron Sputtering

Published online by Cambridge University Press:  01 February 2011

Ibrahim A. Al-Homoudi
Affiliation:
Mechanical Engineering Dept, , Wayne State University, Detroit, Michigan, 48202.
Linfeng Zhang
Affiliation:
Electrical and Computer Engineering Dept, , Wayne State University, Detroit, Michigan, 48202
Erik F. McCullen
Affiliation:
Electrical and Computer Engineering Dept, , Wayne State University, Detroit, Michigan, 48202
Changhe Huang
Affiliation:
Electrical and Computer Engineering Dept, , Wayne State University, Detroit, Michigan, 48202
L. Rimai
Affiliation:
Electrical and Computer Engineering Dept, , Wayne State University, Detroit, Michigan, 48202
R.J. Baird
Affiliation:
Electrical and Computer Engineering Dept, , Wayne State University, Detroit, Michigan, 48202
K.Y. Simon Ng
Affiliation:
Chemical Engineering and Material Science Dept., , Wayne State University, Detroit, Michigan, 48202.
R. Naik
Affiliation:
Physics and Astronomy Dept., Wayne State University, Detroit, Michigan, 48202.
G.W. Auner
Affiliation:
Electrical and Computer Engineering Dept, , Wayne State University, Detroit, Michigan, 48202
G. Newaz
Affiliation:
Mechanical Engineering Dept, , Wayne State University, Detroit, Michigan, 48202.
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Abstract

TiO2 thin films (500 – 1000 nm in thickness) were deposited using pulsed DC magnetron reactive sputtering, on glass substrates. The depositions used a Ti source in an Ar+O2 gas mixture with different parameters of power (350 - 500W), substrate temperature (no additional heat - 400°C), growth pressure (3.0 - 5.0 mTorr) and oxygen gas flow rate (6.0 - 8.0 sccm). The x-ray diffractions (XRD) show amorphous and/or anatase phases depending on the deposition conditions. The films were found to be amorphous at lower substrate temperature and at lower powers. The sample with 4 mTorr, 400W of power, a substrate temperature of 250 C with 7.0 sccm of oxygen flow has the best crystalline quality. The temperature dependent electrical conductivity measurement in air for the above films shows an exponential increase in conductivity with temperature.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

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References

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