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Extreme Phonon Softening in Laser-excited Bismuth – Towards an Inverse Peierls-transition

Published online by Cambridge University Press:  31 January 2011

Wei Lu ,
Matthieu Nicoul ,
Uladzimir Shymanovich ,
Alexander Tarsevitch ,
Martin Kammler ,
Michael Horn-von Hoegen ,
Dietrich von der Linde  and
Klaus Sokolowski-Tinten
Wei Lu
Affiliation:
[email protected], Universität Duisburg-Essen, Duisburg, Germany
Matthieu Nicoul
Affiliation:
[email protected], Universität Duisburg-Essen, Duisburg, Germany
Uladzimir Shymanovich
Affiliation:
[email protected], Universität Duisburg-Essen, Duisburg, Germany
Alexander Tarsevitch
Affiliation:
[email protected], Universität Duisburg-Essen, Duisburg, Germany
Martin Kammler
Affiliation:
[email protected], Universität Duisburg-Essen, Duisburg, Germany
Michael Horn-von Hoegen
Affiliation:
[email protected], United States
Dietrich von der Linde
Affiliation:
[email protected], Universität Duisburg-Essen, Duisburg, Germany
Klaus Sokolowski-Tinten
Affiliation:
[email protected]
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Abstract

Large amplitude coherent optical phonons have been investigated in laser-excited Bismuth by means of femtosecond time-resolved X-ray diffraction. For absorbed laser fluences above 2 mJ/cm2, the experimental data reveal an extreme softening of the excited A1g-mode down to frequencies of about 1 THz, only 1/3 of the unperturbed A1g-frequency. At even stronger excitation the measured diffraction signals no longer exhibit an oscillatory behavior presenting strong indication that upon intense laser-excitation the Peierls-distortion, which defines the equilibrium structure of Bismuth, can be transiently reversed.

Keywords

x-ray diffraction (XRD)Biphase transformation
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1230: Symposium MM – Ultrafast Processes in Materials Science , 2009 , 1230-MM03-05
Copyright
Copyright © Materials Research Society 2010

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References

1 Zeiger, H. J. et al. , Phys. Rev. B. 45, 768 (1992).Google Scholar
2 Sokolowski-Tinten, K. et al. , Nature 422, 287 (2003).Google Scholar
3 Fritz, D. M. et al. , Science 315, 633 (2007).Google Scholar
4 Johnson, S. L. et al. , Phys. Rev. Lett. 100, 155501 (2008).Google Scholar
5 Rousse, A. et al. , Phys. Rev. E50, 2200 (1994).Google Scholar
6 Lu, W. et al. , Phys. Rev. E80, 026404 (2009).Google Scholar
7 Shymanovich, U. et al. , Appl. Phys. B92, 493 (2008).Google Scholar
8 Murray, E. D. et al. , Phys. Rev. B72, 060301 (2005), ibd. 75, 184301 (2007).Google Scholar