Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Hattori, T.
Nohira, H.
Ohishi, K.
Shimizu, Y.
and
Tamura, Y.
1993.
Initial Stage Of SiO2/Si Interface Formation on Hydrogen-Terminated Silicon Surfaces.
MRS Online Proceedings Library,
Vol. 315,
Issue. 1,
p.
387.
Hines, Melissa A.
Harris, Timothy D.
Harris, Alexander L.
and
Chabal, Yves J.
1993.
Looking up the down staircase: Surface Raman spectroscopy as a probe of adsorbate orientation.
Journal of Electron Spectroscopy and Related Phenomena,
Vol. 64-65,
Issue. ,
p.
183.
Aomi, Hideki
Derouin, Francois
and
Ohmi, Tadahiro
1993.
The Adhesion and the Protection of Metallic Impurities at the Interface of Si Wafer Surface with Anion Species.
MRS Online Proceedings Library,
Vol. 315,
Issue. 1,
p.
333.
Hines, Melissa A.
Chabal, Yves J.
Harris, Timothy D.
and
Harris, Alexander L.
1993.
Raman studies of steric hindrance and surface relaxation of stepped H-terminated silicon surfaces.
Physical Review Letters,
Vol. 71,
Issue. 14,
p.
2280.
Watanabe, Satoru
Horiuchi, Key
and
Ito, Takashi
1993.
Stable Hydride-Structures on Si(111) Surface in Pure Water.
MRS Online Proceedings Library,
Vol. 315,
Issue. 1,
p.
447.
Bender, H.
Verhaverbeke, S.
Caymax, M.
Vatel, O.
and
Heyns, M. M.
1994.
Surface reconstruction of hydrogen annealed (100) silicon.
Journal of Applied Physics,
Vol. 75,
Issue. 2,
p.
1207.
Rossow, Uwe
1995.
Epioptics.
p.
39.
Lewis, Lisa B.
Segall, Jeffrey
and
Janda, Kenneth C.
1995.
Recombinative desorption of hydrogen from the Ge(100)–(2×1) surface: A laser-induced desorption study.
The Journal of Chemical Physics,
Vol. 102,
Issue. 18,
p.
7222.
Knobloch, Jürgen
and
Hess, Peter
1996.
Chemical Properties of A-Si:H Interface Layers on Oxide-Covered and Hydrogen-Terminated Silicon.
MRS Proceedings,
Vol. 420,
Issue. ,
Niwano, Michio
1999.
In-situ IR observation of etching and oxidation processes of Si surfaces.
Surface Science,
Vol. 427-428,
Issue. ,
p.
199.
Arima, K.
Endo, K.
Kataoka, T.
Oshikane, Y.
Inoue, H.
and
Mori, Y.
2000.
Scanning tunneling microscopy study of hydrogen-terminated Si(001) surfaces after wet cleaning.
Surface Science,
Vol. 446,
Issue. 1-2,
p.
128.
Liu, Yi
Zhang, Zhanping
Wells, Matthew C.
and
Beebe, Thomas P.
2005.
Growth and Reactions of SiOx/Si Nanostructures on Surface-Templated Molecule Corrals.
Langmuir,
Vol. 21,
Issue. 19,
p.
8883.
Chabal, Yves J.
Higashi, Gregg S.
and
Small, Robert J.
2008.
Handbook of Silicon Wafer Cleaning Technology.
p.
523.
Underwood, Grant
Ballast, Lynette Keller
and
Campion, Alan
2008.
On the existence of a stable, room temperature dihydride-terminated Ge(100) surface in ultrahigh vacuum.
Surface Science,
Vol. 602,
Issue. 12,
p.
2055.
Frank, M. M.
and
Chabal, Y. J.
2009.
Into the Nano Era.
Vol. 106,
Issue. ,
p.
113.
Li, Kejing
Li, Shenggang
Li, Ning
Klein, Tonya M.
and
Dixon, David A.
2011.
Tetrakis(ethylmethylamido) Hafnium Adsorption and Reaction on Hydrogen-Terminated Si(100) Surfaces.
The Journal of Physical Chemistry C,
Vol. 115,
Issue. 38,
p.
18560.
Rupich, Sara M.
and
Chabal, Yves J.
2018.
Handbook of Silicon Wafer Cleaning Technology.
p.
505.
Henriksson, Anders
Neubauer, Peter
and
Birkholz, Mario
2021.
Functionalization of Oxide‐Free Silicon Surfaces for Biosensing Applications.
Advanced Materials Interfaces,
Vol. 8,
Issue. 23,
Shah, S.A.
and
Baldelli, S.
2022.
Vibrational Ground-State depletion for enhanced resolution sum frequency generation microscopy.
Chemical Physics Letters,
Vol. 787,
Issue. ,
p.
139252.
Xu, Xiangdong
Martín‐Yerga, Daniel
Grant, Nicholas E.
West, Geoff
Pain, Sophie L.
Kang, Minkyung
Walker, Marc
Murphy, John D.
and
Unwin, Patrick R.
2023.
Interfacial Chemistry Effects in the Electrochemical Performance of Silicon Electrodes under Lithium‐Ion Battery Conditions.
Small,
Vol. 19,
Issue. 40,