Hostname: page-component-78c5997874-8bhkd Total loading time: 0 Render date: 2024-11-02T22:27:19.169Z Has data issue: false hasContentIssue false
  • English
  • Français

Erbium Doped Silicon Single- and Multilayer Structures for LED and Laser Applications

Published online by Cambridge University Press:  01 February 2011

Zakhary F. Krasilnik ,
Boris A. Andreev ,
Tom Gregorkiewicz ,
Wolfgang Jantsch ,
Mark A.J. Klik ,
Denis I. Kryzhkov ,
Ludmila V. Krasilnikova ,
Viktor P. Kuznetsov ,
Hanka Przybylinska  and
Dmitry Yu. Remizov
...Show all authors
Zakhary F. Krasilnik
Affiliation:
Institute for Physics of Microstructures, Russian Academy of Sciences, GSP-105, Nizhny Novgorod, 603950 Russia
Boris A. Andreev
Affiliation:
Institute for Physics of Microstructures, Russian Academy of Sciences, GSP-105, Nizhny Novgorod, 603950 Russia
Tom Gregorkiewicz
Affiliation:
Van der Waals - Zeeman Institute, University of Amsterdam, Valckenierstraat 65, NL-1018 XE Amsterdam, The Netherlands
Wolfgang Jantsch
Affiliation:
Institute of Semiconductor and Solid State Physics, Johannes Kepler University Linz, A-4040, Linz-Auhof, Austria
Mark A.J. Klik
Affiliation:
Van der Waals - Zeeman Institute, University of Amsterdam, Valckenierstraat 65, NL-1018 XE Amsterdam, The Netherlands
Denis I. Kryzhkov
Affiliation:
Institute for Physics of Microstructures, Russian Academy of Sciences, GSP-105, Nizhny Novgorod, 603950 Russia
Ludmila V. Krasilnikova
Affiliation:
Institute for Physics of Microstructures, Russian Academy of Sciences, GSP-105, Nizhny Novgorod, 603950 Russia
Viktor P. Kuznetsov
Affiliation:
Institute for Physics of Microstructures, Russian Academy of Sciences, GSP-105, Nizhny Novgorod, 603950 Russia
Hanka Przybylinska
Affiliation:
Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, PL-02 668 Warszawa, Poland
Dmitry Yu. Remizov
Affiliation:
Institute for Physics of Microstructures, Russian Academy of Sciences, GSP-105, Nizhny Novgorod, 603950 Russia
Vladimir G. Shengurov
Affiliation:
Institute for Physics of Microstructures, Russian Academy of Sciences, GSP-105, Nizhny Novgorod, 603950 Russia
Viacheslav B. Shmagin
Affiliation:
Institute for Physics of Microstructures, Russian Academy of Sciences, GSP-105, Nizhny Novgorod, 603950 Russia
Margarita V. Stepikhova
Affiliation:
Institute for Physics of Microstructures, Russian Academy of Sciences, GSP-105, Nizhny Novgorod, 603950 Russia
Victor Yu. Timoshenko
Affiliation:
Moscow State University, Physics Faculty, 119992 Moscow, Russia
Nguyen Q. Vinh
Affiliation:
Van der Waals - Zeeman Institute, University of Amsterdam, Valckenierstraat 65, NL-1018 XE Amsterdam, The Netherlands
Artem N. Yablonskiy
Affiliation:
Institute for Physics of Microstructures, Russian Academy of Sciences, GSP-105, Nizhny Novgorod, 603950 Russia
Denis M. Zhigunov
Affiliation:
Moscow State University, Physics Faculty, 119992 Moscow, Russia
Get access

Abstract

The paper is a brief retrospective review of our contribution to the Si:Er problem in the last decade. It contains a description of the experimental facilities, results of the light emitting media (Si:Er and Si1-xGex:Er) research and device applications.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 866 , 2005 , V1.4
Copyright
Copyright © Materials Research Society 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Ennen, H., Schneider, J., Pomrenke, G., Axmann, A., Appl. Phys. Lett. 43, 943 (1983).Google Scholar
2. Ennen, H., Pomrenke, G., Axmann, A., Haydl, W., Schneider, J., Appl. Phys. Lett. 46, 381 (1985).Google Scholar
3. Priolo, F., Franzo, G., Coffa, S., Carnera, A., Phys. Rev. B 57, 4443 (1998).Google Scholar
4. Takahei, K. and Taguchi, A., Mater. Sci. Forum 83-87, 641 (1992).Google Scholar
5. Kuznetsov, V.P., Rubtsova, R.A., Semiconductors 34, 502 (2000).Google Scholar
6. Stepikhova, M.V., Andreev, B.A, Shmagin, V.B., Krasilnik, Z.F., Kuznet, V.P. Shengurov, V.G., Svetlov, S.P., Jantsch, W., Palmetshofer, L. and Ellmer, H., Thin Soli Films 381, 164 (2001).Google Scholar
7. Andreev, B., Chalkov, V., Gusev, O., Emel'yanov, A., Krasilnik, Z., Kuznetsov, V., Pak, P., Shabanov, V., Shengurov, V., Shmagin, V., Sobolev, N., Stepikhova, M. and Svetlov, S., Nanotechnology 13, 97 (2002).Google Scholar
8. Krasilnik, Z.F., Aleshkin, V.Ya., Andreev, B.A., Gusev, O.B., Jantsch, W., Krasilnikova, L.V., Kryzhkov, D.I., Kuznetsov, V.P., Shengurov, V.G., Shmagin, V.B., Sobolev, N.A., Stepikhova, M.V., Yablonsky, A.N. in Towards the First Silicon Laser, edited by Pavesi, L., Gaponenko, S. and Negro, L. Dal, NATO Science Series, (Kluwer, 2003) pp. 445–454.Google Scholar
9. Shmagin, V.B., Kuznetsov, V.P., Remizov, D.Yu., Krasilnik, Z.F., Krasilnikova, L.V., Kryzhkov, D.I., Materials Science & Engineering B 105/1-3, 70 (2004).Google Scholar
10. Jantsch, W., Lanzerstorfer, S., Palmetshofer, L., Stepikhova, M., Preier, H., J.Lumines. 80, 9 (1999).Google Scholar
11. Andreev, B.A., Andreev, A.Yu., Gaponova, D.M., Krasilnik, Z.F., Kuznetsov, V.P., Novikov, A.V., Stepikhova, M.V., Uskova, E.A., Shmagin, V.B., Lanzerstorfer, S., Bulletin of the Russian Academy of Sciences. Physics 64, 269 (2000).Google Scholar
12. Vinh, N.Q., Przybylinska, H., Krasilnik, Z.F., Andreev, B.A and Gregorkiewicz, T., Physica B: Condensed Matter 308-310, 340 (2001).Google Scholar
13. Vinh, N.Q., Przybylińska, H., Krasilnik, Z.F., and Gregorkiewicz, T., Phys. Rev. B70, 102431 (2004).Google Scholar
14. Yablonskiy, A.N., Klik, M.A.J., Andree, B.A., Kuznetsov, V.P., Krasilnik, Z.F., Gregorkiewicz, T., Optical Materials 27, 890 (2005).Google Scholar
15. Shmagin, V.B., Remizov, D.Yu., Obolenskii, S.V., Kryzhkov, D.I., Drozdov, M.N. and Krasilnik, Z.F., Physics of the Solid State 47, 125 (2005).Google Scholar
16. Chynoweth, F.G., McKay, K.G., Phys Rev. 102, 369 (1956).Google Scholar
17. Remizov, D.Yu., Shmagin, V.B., Antonov, A.V., Kuznetsov, V.P., and Krasilnik, Z.F., Physics of the Solid State 47, 98 (2005).Google Scholar
18. Forcales, M., Gregorkiewicz, T., Zavada, J.M., Solid-State Electronics 47, 165 (2003).Google Scholar
19. Stepikhova, M.V., Timoshenko, V.Yu., Shengurov, V.G., Zhigunov, D.M., Shalygina, O.A., Krasilnikova, L.V., Chalko, V.Yu. Svetlov, S.P., Krasilnik, Z.F., Kashkarov, P.K., JETP Letters (2005), submitted.Google Scholar