Hostname: page-component-669899f699-b58lm Total loading time: 0 Render date: 2025-04-29T21:52:06.581Z Has data issue: false hasContentIssue false
  • English
  • Français

Epitaxial Alignment and Microstructural Development in Lithium Niobate Thin Films Prepared by Metallo-Organic Decomposition.

Published online by Cambridge University Press:  15 February 2011

G. Braunstein ,
G. R. Paz-Pujalt  and
T. N. Blanton
G. Braunstein
Affiliation:
Eastman Kodak Company, Rochester NY 14650.
G. R. Paz-Pujalt
Affiliation:
Eastman Kodak Company, Rochester NY 14650.
T. N. Blanton
Affiliation:
Eastman Kodak Company, Rochester NY 14650.
Get access

Abstract

We investigate the microstructural evolution and epitaxial alignment of thin films of LiNbO3 deposited by the Metallo-organic decomposition method on Al2O3. The LiNbO3 films are prepared by spin coating and thermal decomposition of a solution of Metallo-organic precursors on single-crystal, <0001> oriented, Al2O3 substrates, followed by heat treatment in a quartz tube furnace at temperatures ranging from 500 to 1000 °C.

X-ray diffraction analysis reveals that films heat treated at 600 °C for 1 h are highly oriented along the c-axis direction, but the alignment is not good enough to permit channeling of 2 MeV He++ particles. Heat treatment at 900 °C improves significantly the epitaxial alignment as determined by ion-channeling measurements. However, concomitantly with the improvement in crystal orientation, the films break up into a network of LiNbO3 grains, partially uncovering the Al2O3 substrates along grain boundaries. Pole figure analysis shows that all the grains share the same in-plane orientation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 317: Symposium B – Mechanisms of Thin Film Evolution , 1993 , 571
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

[1] Braunstein, G. and Paz-Pujalt, G. R., presented at this symposium.Google Scholar
[2] Mantese, J. V., Micheli, A. L., Hamdi, A. H. and Vest, R. W., MRS Bulletin, Vol. XIV, No. 10, October 1989, pp. 48–53.Google Scholar
[3] Peterson, G., Ballman, A., Lenzo, P., and Bridenbaugh, M., Appl. Phys. Lett. 5, 62 (1964).Google Scholar
[4] Boyd, G., Miller, R., Nassau, K., Bond, W., and Savage, A., Appl. Phys. Lett., 5, 234 (1964).Google Scholar
[5] Nashimoto, K., Cima, M. J., and Rhine, W. E., Mat. Res. Soc. Symp. Proc., 202, 439 (1991).CrossRefGoogle Scholar
[6] Xu, J. J., Shaikh, A. S., and Vest, R. W., Thin Solid Films, 161, 273 (1988).Google Scholar