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Published online by Cambridge University Press: 10 February 2011
Phase contrast techniques in the transmission electron microscope are used to measure directly the electrostatic potentials at θ = 24° [001] symmetrical tilt grain boundaries in both undoped and Nb-doped SrTiO3 bicrystals. The boundaries are all found to have significantly lower scattering potentials than the surrounding bulk material. The depths and the shapes of the potential wells at the boundaries are discussed in the light of both theoretical models of the grain boundary chemistry of pure and doped strontium titanate and other experimental data that we have acquired on these boundaries from high resolution transmission electron microscopy, diffuse dark field imaging, energy dispersive X-ray spectroscopy and electron energy loss spectroscopy.