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Electron Energy Loss Spectroscopy of Polycrystalline and Ion Irradiated Ni-Al Alloys

Published online by Cambridge University Press:  22 February 2011

L.A. Grunest ,
J.C. Barbour ,
L.S. Hung ,
J.W. Mayer  and
J.J. Ritsko
L.A. Grunest
Affiliation:
Xerox Webster Research Center- W114, Webster, New York 14580
J.C. Barbour
Affiliation:
Dept. of Materials Science and Engineering, Cornell University Ithaca, New York 14853
L.S. Hung
Affiliation:
Dept. of Materials Science and Engineering, Cornell University Ithaca, New York 14853
J.W. Mayer
Affiliation:
Dept. of Materials Science and Engineering, Cornell University Ithaca, New York 14853
J.J. Ritsko
Affiliation:
IBM Thomas J. Watson Research CenterPO Box 218, Yorktown Heights, New York 10598
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Abstract

Ion beam modifications to thin film, polycrystalline Ni-Al alloys have been investigated using high resolution (0.1 eV FWHM) transmission electron energy loss spectroscopy (EELS). The ion induced modification of Ni3 AI,NiAI, Ni2Al3, and NiAl3 as measured by EELS, are compared to concurrent electron microscope diffraction analyses. The EELS coresub level spectra corroborate the NiAI3 to amorphous phase transition observed by diffraction, while the EELS valence spectra provide a signature for the Ni2Al3 to NiAl phase transformation. These results reflect the changes in the electronic states caused by changes in the crystal structure. In addition, perturbations to the electronic states are measured even when no change appears in the diffraction pattern (irradiated NiAl). Thus, high resolution EELS is shown to be a sensitive analytical technique for studying ion irradiated materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 25: Symposium C – Thin Films and Interfaces II , 1983 , 229
Copyright
Copyright © Materials Research Society 1984

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References

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