Hostname: page-component-78c5997874-4rdpn Total loading time: 0 Render date: 2024-11-08T08:24:06.640Z Has data issue: false hasContentIssue false

Electron Density Effects in the Modulation Spectroscopy of Strained and Lattice-Matched InGaAs/InAlAs/InP HEMTs.

Published online by Cambridge University Press:  15 February 2011

A. Dimoulas
Affiliation:
California Institute of Technology, Chemical Engineering 210–41, Pasadena, CA 91125
J. Davidow
Affiliation:
California Institute of Technology, Chemical Engineering 210–41, Pasadena, CA 91125
K. P. Giapis
Affiliation:
California Institute of Technology, Chemical Engineering 210–41, Pasadena, CA 91125
A. Georgakilas
Affiliation:
Foundation for Research and Technology-Hellas P.O. Box 1527, Heraklion 711 10, Greece
G. Halkias
Affiliation:
Foundation for Research and Technology-Hellas P.O. Box 1527, Heraklion 711 10, Greece
N. Kornelios
Affiliation:
Foundation for Research and Technology-Hellas P.O. Box 1527, Heraklion 711 10, Greece
Get access

Abstract

The effects of the channel electron density on the interband optical transitions of strained (x = 0.6 and 0.65) and lattice-matched (x = 0.53) lnxGa1−xAs/In0.52Al0.48As/InP high electron mobility transistor structures have been investigated by phototransmittance at room temperature. Analysis of the ground and first excited transitions for low and high densities, respectively, enabled a separate estimation of the electron densities occupying each one of the first two subbands. It was found necessary to include the modulation of the phase-space filling in the analysis of the spectra, especially for the samples with a high electron density, in which case this mechanism becomes dominant.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. See a review article by Pollak, F.H. and Shen, H., Mat. Sci. Eng. R-10, 275 (1993), and ref. therein.Google Scholar
2. Yin, Y., Qiang, H., Pollak, F.H., Streit, D.C., and Wojtowicz, M., Appl. Phys. Lett. 61, 1579 (1992).Google Scholar
3. Dimoulas, A., Zekentes, K., Androulidaki, M., Kornelios, N., Michelakis, C., and Hatzopoulos, Z., Appl. Phys. Lett. 63, 1417 (1993).Google Scholar
4. Gumbs, G., Huang, D., Yin, Y., Qiang, H., Yan, D., Pollak, F.H., and Noble, T.F., Phys. Rev. B 48, 18328 (1993).Google Scholar
5. Snow, E.S., Glembocki, O.J., and Shanabrook, B.V., Phys. Rev. B 38, 12483 (1988).Google Scholar
6. Dimoulas, A. Leng, J., Giapis, K.P., Georgakilas, A., Michelakis, C., and Christou, A., Phys. Rev. B 47, 7198 (1993).Google Scholar
7. Joseph, I. Bar, Kuo, J.M., Klingshirn, C., Livescu, G., Chang, T.Y., Miller, D.A.B., and Chemla, D.S., Phys. Rev. Lett. 59, 1357 (1987).Google Scholar