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Electrodeposited Metallic Nanowires as a Scanning Probe Tip

Published online by Cambridge University Press:  31 January 2011

Munekazu Motoyama  and
Fritz B. Prinz
Munekazu Motoyama
Affiliation:
[email protected], Stanford University, Mechanical Engineering, Stanford, California, United States
Fritz B. Prinz
Affiliation:
[email protected], Stanford University, Mechanical Engineering, Stanford, California, United States
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Abstract

This paper describes lateral deformations of electrodeposited Ni nanowires as an atomic force microscope (AFM) probe tip. The maximum end deflections for nanowires to break the elasticity, which beam mechanics indicates, were applicable to our observed results.

Keywords

scanning probe microscopy (SPM)electrodepositionnanostructure
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1206: Symposium M – Multifunction at the Nanoscale through Nanowires , 2009 , 1206-M18-03
Copyright
Copyright © Materials Research Society 2010

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