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Electrical Properties of Pd-contacted Single-walled Carbon Nanotubes: A Scanning Probe Microscopy Study

Published online by Cambridge University Press:  01 February 2011

Oleg Kononenko ,
S I Bozhko ,
V N Matveev ,
V T Volkov ,
M A Knyazev ,
A I Il'in ,
D V Matveev ,
Yu A Kasumov  and
I I Khodos
Oleg Kononenko
Affiliation:
[email protected], Institute of Microelectronics Technology and High Purity Materials, RAS,, Chernogolovka, Russian Federation
S I Bozhko
Affiliation:
[email protected], Institute of Solid State Physics, RAS,, Chernogolovka, Russian Federation
V N Matveev
Affiliation:
[email protected], Institute of Microelectronics Technology and High Purity Materials, RAS,, Chernogolovka, Russian Federation
V T Volkov
Affiliation:
[email protected], Institute of Microelectronics Technology and High Purity Materials, RAS,, Chernogolovka, Russian Federation
M A Knyazev
Affiliation:
[email protected], Institute of Microelectronics Technology and High Purity Materials, RAS,, Chernogolovka, Russian Federation
A I Il'in
Affiliation:
[email protected], Institute of Microelectronics Technology and High Purity Materials, RAS,, Chernogolovka, Russian Federation
D V Matveev
Affiliation:
[email protected], Institute of Solid State Physics, RAS,, Chernogolovka, Russian Federation
Yu A Kasumov
Affiliation:
[email protected], Institute of Microelectronics Technology and High Purity Materials, RAS,, Chernogolovka, Russian Federation
I I Khodos
Affiliation:
[email protected], Institute of Microelectronics Technology and High Purity Materials, RAS,, Chernogolovka, Russian Federation
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Abstract

Pd is widely used in producing electrodes to single-walled carbon nanotubes (SWNT). However up to now its ability to form ohmic contacts to SWNTs was not employed in scanning probe microscopy (SPM). Here we present a study of SWNTs with Pd electrodes by SPM using Pd-coated tips. SWNTs were selectively grown on oxidized silicon substrates by low pressure CVD method. Pd electrodes were prepared to SWNTs to fabricate two terminal structures for SWNTs resistance measurements. It is shown that SPM Kelvin mode is a reliable technique for SWNT detection on insulating substrate. Contact potential difference between Pd electrode and SWNT is measured using the Kelvin mode.

Keywords

chemical vapor deposition (CVD) (deposition)scanning probe microscopy (SPM)electrical properties
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1258: Symposia P/Q/R – Low-Dimensional Functional Nanostructures-Fabrication, Characterization and Applications , 2010 , 1258-R10-19
Copyright
Copyright © Materials Research Society 2010

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