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Electrical and Structural Diagnostics of Barium Strontium Titanate (BST) Thin Films

Published online by Cambridge University Press:  23 March 2011

Supriya Ketkar
Affiliation:
Department of Electrical Engineering, University of South Florida, Tampa, Fl 33620
Manoj Kumar Ram
Affiliation:
Department of Mechanical Engineering, University of South Florida, Tampa, Fl 33620 Nanotechnology Research and Education Center, University of South Florida, Tampa, Fl 33620
Ashok Kumar
Affiliation:
Department of Mechanical Engineering, University of South Florida, Tampa, Fl 33620 Nanotechnology Research and Education Center, University of South Florida, Tampa, Fl 33620
Thomas Weller
Affiliation:
Department of Electrical Engineering, University of South Florida, Tampa, Fl 33620
Andrew Hoff
Affiliation:
Department of Electrical Engineering, University of South Florida, Tampa, Fl 33620
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Abstract

The properties of radio frequency, rf magnetron sputtered Barium Strontium Titanate (Ba1-xSrxTiO3), BST, thin films were investigated and compared with BST thin films deposited by sol-gel method with the aim of determining relationships between the oxide deposition parameters, the film structure, and the electric field dependence. This work presents noncontact electrical characterization of BST films using Corona Kelvin metrology (C-KM) which has been employed earlier only in the silicon industry. The films were structurally characterized using thickness profilometer, X-ray diffraction (XRD) and atomic force microscopy (AFM) techniques. The use of sol-gel technique to fabricate small area metal-insulator-metal (MIM) structures is found to be beneficial from the point of saving fabrication time and production costs.

Type
Research Article
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

1. Zimmermann, F., Voigts, M., Menesklou, W., Ivers-Tiffe´e, E., J. of the Europ. Cer. Soc. 24, 1729 (2004).Google Scholar
2. Sharma, A., Ban, Z.-G., Alpay, S. P., and Mantese, J. V., Appl. Phys. Lett. 85, 985 (2004)Google Scholar
3. Fiedziuszko, S. J., Hunter, I. C., Itoh, T., Kobayashi, Y., Nishikawa, T., N.Stitzer, S., and Wakino, K., IEEE Trans. Microwave Theory Tech., 50, 706 (2002).Google Scholar
4. Galt, D. and Price, J.C., IEEE Trans. Appl. Supercond., 5, 2575 (1995).Google Scholar
5. Findikoglu, A.T., Jia, Q.X., and Reagor, D.W., IEEE Trans.Appl. Supercond., 7, 2925 (1997).Google Scholar
6. Gevorgian, S.S., Carlsson, E.F., Rudner, S., Helmersson, U., Kollberg, E.L., Wikborg, E., and Vendik, O.G., IEEE Trans. Appl. Supercond., 7, 2458 (1997).Google Scholar
7. Ghosh, D., “Tunable Microwave Devices Using BST (Barium Strontium Titanate) And Base Metal ElectrodesPhD Thesis, NC State (2005).Google Scholar
8. Lancaster, M. J., Powell, J., and Porch, A., Semicond. Sci. Technol. 11, 1323 (1998).Google Scholar
9. Lee, S.-J., Moon, S. E., Kwak, M.-H., Kim, Y.-T., Ryu, H.-C., and Han, S.-K., Appl. Phys. Lett. 82, 2133 (2003).Google Scholar
10. Kumar, Ashok, Manavalan, Sriraj G., Surface & Coatings Technology 198, 406 (2005).Google Scholar
11. Chang, W., Kirchoefer, S. W., Pond, J. M., and Horwitz, J. S., J. Appl. Phys. 92, 1528 (2002).Google Scholar
12. Van Keuls, F. W., Mueller, C. H., Miranda, F. A., Romanofsky, R. R., Canedy, C. L., Aggarwal, S., Venkatesan, T., Ramesh, R., Horwitz, J. S., Chang, W., and Kim, W.-J., IEEE MTT-S Int. Microwave Symp. Dig. 2, 737 (1999).Google Scholar
13. Gurumurthy, , Venkataramanan, , Jeedigunta, , Sathyaharish, , Baylis, , Sam, , Spagnol, , Priscila, , Bumgarner, , John, , Kumar, , Ashok, , Weller, , Thomas, , Ferroelectrics 377, 75 (2008).Google Scholar
14. Carlson, C. M., Rivkin, T. V., Parilla, P. A., Perkins, J. D., Ginley, D. S., Kozyrev, A. B., Oshadchy, V. N., and Pavlov, A. S., Appl. Phys. Lett. 76, 1920 (2000)Google Scholar
15. Moon, Seung Eon, Kim, Eun-Kyoung, Kwak, Min-Hwan, Ryu, Han-Cheol, Kim, Young-Tae, Kang, Kwang-Yong, Lee, Su-Jae, Kim, Won-Jeong, App. Phys. Lett, 83, 2166 (2003).Google Scholar
16. Ahn, Jinyong, Lee, Joseph Y., Kim, Joonsung, Yoo, JeGwang, and Ryu, Changsup, IEEE. 7th Intern. Conf on Elect. Packg. Techn, (2006).Google Scholar
17. Remmel, Thomas et al. , JCPDS-International Centre for Diffraction Data (1999).Google Scholar
18. APC International Ltd, 90, 1015 (2002).Google Scholar
19. Robertson, J., Jou. of Non-Crystalline Solids 303, 94 (2002).Google Scholar
20. Robertson, J., J. Vac. Sci. Technol. B 18(3), (2000).Google Scholar