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Effects of Y and Zr Dopants on Grain Boundary Structure in Creep Resistant Polycrystalline Alumina

Published online by Cambridge University Press:  21 March 2011

G. S. Cargill III
Affiliation:
Department of Materials Science and Engineering Lehigh University Bethlehem, PA 18015, USA
C. M. Wang
Affiliation:
Department of Materials Science and Engineering Lehigh University Bethlehem, PA 18015, USA
J. M. Rickman
Affiliation:
Department of Materials Science and Engineering Lehigh University Bethlehem, PA 18015, USA
H. M. Chan
Affiliation:
Department of Materials Science and Engineering Lehigh University Bethlehem, PA 18015, USA
M. P. Harmer
Affiliation:
Department of Materials Science and Engineering Lehigh University Bethlehem, PA 18015, USA
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Abstract

Dopants Y and Zr at 100 ppm levels in high purity, micron grain-size polycrystalline alumina are mainly segregated to the alumina grain boundaries and strongly reduce high temperature creep. Information about this segregation has come from high resolution STEM composition mapping experiments. Information about local structural surroundings of the dopant atoms has come from EXAFS experiments, and information about local bonding of the dopant atoms has come from XANES experiments. Structural models for dopant grain boundary segregation provide a context for these experimental results and for effects of dopant incorporation on grain boundary mediated transport. Recent experimental and theoretical results are discussed in this paper.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

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