Published online by Cambridge University Press: 25 February 2011
The oxidation behavior of Ni, implanted with either divalent Ce2+ or trivalent Y3+, has been studied to test the general applicability of the grain boundary segregation explanation for the reduction in rate of oxidation resulting from reactive element additions to metals that form protective oxide scales. Oxidation of Ce- and Y-implanted Ni at 900°C resulted in grain boundary segregation of the implanted species in the NiO scales formed. The rate of oxidation of Ni was reduced and there was evidence for a change in oxidation mechanism. Additionally, the grain size of the oxides was much smaller. All the observations were entirely consistent with a reduction in cation transport resulting from segregation of foreign ions at the oxide grain boundaries. These results on Ni are compared with recent studies of Ce- and Y-implanted Cr to draw general conclusions about the relationship between grain boundary segregation in oxides and the reactive element effect on oxidation.