Hostname: page-component-7bb8b95d7b-lvwk9 Total loading time: 0 Render date: 2024-09-15T01:51:16.780Z Has data issue: false hasContentIssue false

Effect of Thermal Equilibration on Dark- and Photo-Conductivities in Undoped Amorphous Silicon-Germanium Alloys

Published online by Cambridge University Press:  25 February 2011

J. Z. Liu
Affiliation:
Department of Electrical Engineering, Princeton University, Princeton, NJ 08544
D. S. Shen
Affiliation:
Department of Electrical Engineering, Princeton University, Princeton, NJ 08544
P. Roca i Cabarrocas
Affiliation:
Department of Electrical Engineering, Princeton University, Princeton, NJ 08544
H. Park
Affiliation:
Department of Electrical Engineering, Princeton University, Princeton, NJ 08544
S. Wagner
Affiliation:
Department of Electrical Engineering, Princeton University, Princeton, NJ 08544
Get access

Abstract

We report the effect of thermal equilibration on the dark- and photo- conductivities of an un-doped a-Si,Ge:H,F with optical gap of 1.47 eV. Annealing at high temperature and subsequent quenching can freeze in the equilibrium configuration at the annealing temperature. The characteristic glass-like transition behavior of the conductivities was observed and used to estimate a freeze-in temperature of about 140°C. As the annealing temperature increases above the freeze-in temperature, the frozen-in dark- and photo- conductivities decrease, the photo- to dark- conductivity ratio increases, and the photoconductivity-generation rate exponent increases. These changes in conductivities are explained by a model calculation, which assumes that the quenching introduces new defect states to die lower energy flanks of the Gaussian defect distributions.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

For a recent review, see Advances in Amorphous Semiconductors. Vol. I, ed. by Fritzsche, H., (World Scientific Publication, Singapore, 1988), chapter 2.Google Scholar
Liu, J.Z., Chu, V., Shen, D., Slobodin, D., and Wagner, S., Phys. Rev. B 40, 6424 (1989).Google Scholar
Slobodin, D., Aljishi, S., Schwarz, R., and Wagner, S. in Materials Issues in Applications of Amorphous Silicon Technology, edited by Adler, D., Madan, A., and Thompson, M.J. (Mater. Res. Soc. Proc. 49, Pittsburgh, PA 1985) pp. 153160.Google Scholar
Smith, Z E., Aljishi, S., Shen, D.S., Chu, V., Slobodin, D., and Wagner, S., in Stability of Amorphous Silicon Allov Materials and Devices. AIP Conf. Proc. 157, ed. by Stafford, B.L. and Sabisky, E. (AIP, New York, 1987), p. 171.Google Scholar
5. McMahon, T.J. and Tsu, R., Appl. Phys. Lett., 51 412 (1987).Google Scholar
6. Meaudre, R., Jensen, P., and Meaudre, M., Phys. Rev. B 38 12449 (1988).Google Scholar
7. Smith, Z E., Aljishi, S., Slobodin, D., Chu, V., Wagner, S., Lenahan, P.M., Arya, R.R., and Bennett, M.S., , Phys. Rev. Lett., 57, 42094224 (1986).Google Scholar
8. Xu, X., Okumura, A., Morimoto, A., Kumeda, M., and Shimizu, T., Phys. Rev. B 38 8371 (1988).Google Scholar
9. Street, R.A. and Winer, K., Phys. Rev. B 40, 6236 (1989).Google Scholar
10. Taylor, G.W. and Simmons, J.G., J. Non-Cryst. Solids, 8 –10. 940946 (1972).Google Scholar
11. Rose, A., Concepts in Photoconductivity and Allied Problems (Robert E. Krieger Publishing, Huntington, New York, 1978), pp. 4041.Google Scholar
12. Ley, L., in The Physics of Amorphous Silicon II. ed. by Joannopoulos, J.D. and Lucovsky, G. (Springer-Verlag, 1984), p. 104.Google Scholar
13. Wagner, S., Chu, V., Shen, D.S., Conde, J.P., Aljishi, S., and Smith, Z E. in Amorphous Silicon Technology, edited by Hamakawa, Y., LeComber, P.G., Madan, A., Taylor, P.C., and Thompson, M.J. (Mater. Res. Soc. Proc. iiS, Pittsburgh, PA 1988) pp. 623633.Google Scholar
14. Branz, H.M., Capuder, K., Lyons, E.H., Haggerty, J.S., and Adler, D., Phys. Rev. B 36 7936 (1987).Google Scholar
15. Liu, J.Z. and Wagner, S., to be published.Google Scholar
16. Assuming γ = 0.78 (Fig. 5) yields kTg / kTm = 3.5. Therefore the condition (EFn - EF) >> kTg is not well satisfied.>+kTg+is+not+well+satisfied.>Google Scholar