Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-03T08:35:34.804Z Has data issue: false hasContentIssue false

Effect of Oxygen Partial Pressure on Stability of High-Tc Phase in Sintered Bi-Pb-Sr-Ca-Cu-O Superconductos

Published online by Cambridge University Press:  28 February 2011

H.K. Lee
Affiliation:
Korea Standards Research Institute, P.O.Box 3, Taedok Science Town, Taejon, 305–606, Korea
K.W. Lee
Affiliation:
Korea Standards Research Institute, P.O.Box 3, Taedok Science Town, Taejon, 305–606, Korea
D.H. Ha
Affiliation:
Korea Standards Research Institute, P.O.Box 3, Taedok Science Town, Taejon, 305–606, Korea
J.C. Park
Affiliation:
Korea Standards Research Institute, P.O.Box 3, Taedok Science Town, Taejon, 305–606, Korea
Get access

Abstract

The effect of oxygen partial pressure on stability of high-Tc phase in Bi-Pb-Sr-Ca-Cu-O system has been investigated using x-ray diffraction, resistivity and a.c. susceptibility measurements. It was found that part of the high-Tc phase in Bi-Pb-Sr-Ca-Cu-O system was transformed into the low-Tc phase (80 K) and insulating phases by heating in the temperature range 600 C to 880°C in O2 of one atmosphere. The original high-Tc phase was restored upon retreatment in a low oxygen partial pressure of 0.1 atmosphere. The reversible superconducting phase transformation is discussed in conjunction with the formation mechanism of the high-Tc phase in Bi-Pb-Sr-Ca-Cu-O system.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Maeda, H., Tanaka, Y., Fukutomi, M., and Asano, J., Jpn. J. Appl. Phys., 27, L209 (1988).Google Scholar
2 Green, S.M., Jiang, C., Yu Mei, , Luo, H.L., and Politis, C., Phys. Rev., B38, 5016 (1988).Google Scholar
3 Takano, M., Takada, J., Oda, K., Kitaguchi, H., Miura, Y., Ikeda, Y., Momii, Y., and Mazaki, H., Jpn. J. Appl. Phys., 27, L1041 (1988).Google Scholar
4 Endo, U., Koyama, S., and Kawai, T., Jpn, J. Appl. Phys., 27, L1476 (1988).Google Scholar
5 Lee, H.K., Lee, K.W., Ha, D.H., Park, K., and Park, J.C., Appl. Phys. Lett., 55, 1249 (1989).Google Scholar
6 Tarascon, J.M., Le Page, Y., Barboux, P., Gagley, B.G., Greene, L.H., Mckinnon, W.R., Hull, G.W., Girond, M., and Hwang, D.M., Phys. Rev., B37, 9382 (1988).Google Scholar
7 Muromachi, E.T., Uchida, Y., Ono, A., Izumi, F., Onoda, M., Matsui, Y., Kosuda, K., Takekawa, S., and Kato, K., Jpn. J. Appl. Phys.,27, L365 (1988).Google Scholar
8 Mazaki, H., Takano, M., and Takeda, Y., Jpn. J. Appl. Phys.,26, L780 (1987).Google Scholar
9 Sumiyama, A., Endo, H., Tsuchiya, J., Kijima, N., Mizuno, M., and Oguri, Y., Jpn. J. Appl. Phys., 28, L373 (1989).Google Scholar
10 Nobumasa, H., Shimizu, K., Kitano, Y., and Kawai, T., Jpn. J. Appl. Phys., 27, L846 (1988).Google Scholar
11 Kijima, N., Endo, H., Tsuchiya, J., Sumiyama, A., Mizuno, M., and Oguri, Y., Jpn. J. Appl. Phys., 27, L1852 (1988).Google Scholar
12 Lee, H.K., Lee, K.W., Park, K., Huang, N.M., Oh, O.K., Kim, J.S., Yoo, K.H., Kim, Y.B., Kim, C.S., Cho, Y.K., Park, J.C., J. Appl. Phys., 63, 568 (1988).Google Scholar