Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-28T03:10:44.488Z Has data issue: false hasContentIssue false

Effect of Grain Size and Magnetic Switching Volume on Media Noise Due to Intergranular Coupling in CoCrTaPt/Cr Thin Film Media

Published online by Cambridge University Press:  10 February 2011

Sudhir S. Malhotra
Affiliation:
HMT Technology, Fremont, CA 94538
Brij B. Lal
Affiliation:
HMT Technology, Fremont, CA 94538
Michael A. Russak
Affiliation:
HMT Technology, Fremont, CA 94538
Get access

Abstract

In this work the effect of grain size and magnetic switching volume on media noise due to intergranular coupling for CoCrTaPt/Cr thin film media deposited at substrate temperature of 160 and 260°C are investigated. The film deposited at substrate temperature of 260°C showed weaker intergranular interaction and lower media noise compared to the film deposited at 160°C. The magnetic switching volume (V*) is an important consideration for thermal stability and media noise in high density recording media. The magnetic switching volume V* for the film deposited at 160 and 260°C was calculated to be 3.7 x 10-18 and 3.2 x 10-18 cm3 respectively. The magnetic switching volume is correlated to the average Co-alloy grain size, media noise and the interactions between the grains.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Sharrock, M. P., IEEE Trans. Magn., vol. 26, pp. 193197, (1990).Google Scholar
2. Lu, P. and Charap, S.H., J. Appl. Phys., vol. 75, pp. 57685770, (1994).Google Scholar
3. Kelly, P. E., O'Grady, K., Mayo, P.I. and Chantrell, R.W., IEEE Trans. Magn., vol. 25, pp. 38813883, (1989).Google Scholar
4. Judy, J. H., IEEE Trans. Magn. vol. 29, pp. 209211, (1993).Google Scholar
5. Bruno, P., Bayreuther, G., Beauvillian, P., Chappert, C., Lugert, G., Ranard, D., and Seiden, J., J. Appl. Phys., vol. 68, pp. 57595761, (1990).Google Scholar
6. Singleton, E. W., Shan, Z. S., Jeong, Y.S. and Sellmyer, D. J., IEEE Trans. Magn., vol. 31, [[.27432745, (1995).Google Scholar
7. Malhotra, S. S., Shan, Z. S, Stafford, D. C., Liou, S. H. and Sellmyer, D. J., IEEE Trans. Magn. vol. 32, pp. 40194021, (1996).Google Scholar