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Effect of Experimental Noise on Recovery of the Electronic Density of States from Transient Photocurrent Data

Published online by Cambridge University Press:  17 March 2011

Steve Reynolds ,
Charlie Main  and
Mariana J. Gueorguieva
Steve Reynolds
Affiliation:
School of Science and Engineering, University of Abertay Dundee, Bell Street, Dundee DD1 1HG, U.K.
Charlie Main
Affiliation:
School of Science and Engineering, University of Abertay Dundee, Bell Street, Dundee DD1 1HG, U.K.
Mariana J. Gueorguieva
Affiliation:
School of Science and Engineering, University of Abertay Dundee, Bell Street, Dundee DD1 1HG, U.K.
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Abstract

The effects of random noise on density of states determination from transient photocurrent data are examined by superimposing noise levels similar to those found experimentally (1% to 20%) on computer-simulated current-time data. Mathematically approximate methods based on Fourier and Laplace transformations are found to operate effectively at noise levels of up to 20%. Mathematically exact methods offer higher resolution, but this is compromised by greater susceptibility to noise. A Tikhonov regularisation method yields both high resolution and good noise tolerance.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 664: Symposium A – Amorphous and Heterogeneous Silicon-Based Films-2001 , 2001 , A22.6
Copyright
Copyright © Materials Research Society 2001

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References

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