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Development Of Transparent Lsco and Lscno Conductors for Optical Shutter Systems

Published online by Cambridge University Press:  21 March 2011

R. W. Schwartz ,
M. T. Sebastian ,
M. Charoenwongsa  and
H. Dobberstein
R. W. Schwartz
Affiliation:
The Gilbert C. Robinson Department of Ceramic and Materials EngineeringClemson UniversityClemson, SC
M. T. Sebastian
Affiliation:
The Gilbert C. Robinson Department of Ceramic and Materials EngineeringClemson UniversityClemson, SC
M. Charoenwongsa
Affiliation:
The Gilbert C. Robinson Department of Ceramic and Materials EngineeringClemson UniversityClemson, SC
H. Dobberstein
Affiliation:
The Gilbert C. Robinson Department of Ceramic and Materials EngineeringClemson UniversityClemson, SC
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Abstract

We have prepared lanthanum strontium cobalt oxide (La0.50Sr0.50CoO3; LSCO 50/50) and lanthanum strontium cobalt nickel oxide (La0.50Sr0.50Co0.50Ni0.50O3; LSCNO) as candidate transparent electrodes for use in a shutter-based infrared sensor protection device. The shutter device requires that the electrode be transparent (80% transmission) and have moderate sheet resistance (300 ω/sq.). Because of the effects of film thickness on intrinsic material properties, such as resistivity and extinction coefficient, and simple engineering issues (i.e., the relationship between film thickness, resistance and transmission), films of various thicknesses were prepared to achieve an optimal balance of electrical and optical performance. van der Pauw measurements and FTIR spectroscopy were used to study thin film properties. The best LSCO films prepared demonstrated electrical (438 ω/sq.) and optical (68% transmission at 8 µm) properties that did not meet the target property goals for this application. However, the LSCNO films (of optimal thickness) offered performance (323 µ/sq. and 73% transmission) close to the device requirements.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 666: Symposium F – Transport and Microstructural Phenomena , 2001 , F11.7
Copyright
Copyright © Materials Research Society 2001

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References

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