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Development of A Technique for the In-Situ Measurement of the Mechanical Properties of Ultra-Thin Interfacially Polymerized Films

Published online by Cambridge University Press:  21 February 2011

Alan R. Greenberg ,
Vivek P. Khare  and
William B. Krantz
Alan R. Greenberg
Affiliation:
Department of Mechanical Engineering, University of Colorado at Boulder, CO 80309–0427
Vivek P. Khare
Affiliation:
Department of Chemical Engineering, University of Colorado at Boulder, CO 80309–0424
William B. Krantz
Affiliation:
Department of Chemical Engineering, University of Colorado at Boulder, CO 80309–0424
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Abstract

Crosslinked polyamide barrier layers made by a self-limiting interfacial polymerization (IP) process are extremely thin (= 1000 Å), relatively defect-free and possess excellent perm selective properties which enable their commercial application in thin film composite (TFC) membranes. Little information has been reported in the open literature concerning the physical as well as mechanical properties of these polyamide IP films due to the substantial difficulties in making direct measurements on such thin crosslinked materials. Consequently, the development of IP-TFC membranes for commercial separations has been largely a trial-and-error process.

We are developing a novel experimental technique, Pendant Drop Mechanical Analysis (PDMA) that utilizes the capabilities of the pendant-drop tensiometer for in-situ measurements of the mechanical behavior of the IP films. The current effort focuses on relating the mechanical behavior of the IP films to their structure, which in turn will be related to the permselective performance. Preliminary PDMA results indicate significant differences in the mechanical behavior of the IP films as a function of composition and contact time. These differences can be related to changes in the network characteristics.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 356: Symposium B2 – Thin Films: Stresses and Mechanical Properties V , 1994 , 541
Copyright
Copyright © Materials Research Society 1995

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