Hostname: page-component-78c5997874-t5tsf Total loading time: 0 Render date: 2024-11-02T21:21:11.987Z Has data issue: false hasContentIssue false

Determination of the Number of Molecules Bonded to a CdSe Nanocrystallite Surface

Published online by Cambridge University Press:  21 February 2011

Sara Majetich
Affiliation:
Department of Physics, Carnegie Mellon University, Pittsburgh, PA 15213
Jennifer Newbury
Affiliation:
Department of Physics, Carnegie Mellon University, Pittsburgh, PA 15213
Dale Newbury
Affiliation:
National Institute of Standards and Technology, Surface and Microanalysis Science Division, Gaithersburg, MD 20899
Get access

Abstract

Electron excited energy dispersive X-ray spectrometry (EDS) was used to determine the atomic species present in 35 Å diameter CdSe nanocrystallites. Both theoretical modeling and experimental calibration with standard materials were used to relate the relative X-ray intensities to the atomic fractions present in the sample. The EDS results were normalized to those found by elemental analysis, which also detects light elements. With different surface models, and the atomic fractions found by EDS, the number of surface groups per nanocrystallite was determined.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Andres, R. P., Averback, R. S., Brown, W. L., Brus, L. E., Goddard, W. A. III, Kaldor, A., Louie, S. G., Moscovits, M., Peercy, P. S., Riley, S. J., Siegel, R. W., Spaepen, F., and Wang, Y., J. Mater. Res. 4, 704 (1989).Google Scholar
2. Steigerwald, M. L., Alivisatos, A. P., Gibson, J. M., Harris, T. D., Kortan, R., Muller, A. J., Thayer, A. M., Duncan, T. M., Douglass, D. C., and Brus, L. E., J. Am. Chem. Soc. 110, 3046 (1988).CrossRefGoogle Scholar
3. Majetich, S. A. and Carter, A. C., J. Chem. Phys. 97, 8727 (1993).Google Scholar
4. Majetich, S. A., Carter, A. C., Belot, J., and McCullough, R. D., J. Phys. Chem. (under review).Google Scholar
5. Egerton, R. F., Electron Energy Loss Spectroscopy in the Electron Microscope, Plenum Press, New York, 1986, pp. 357359.Google Scholar
6. Lippens, P. E. and Lannoo, M., Phys. Rev. B39, 10935 (1989).CrossRefGoogle Scholar
7. Kagan, C. R. and Cima, M. J., in Microcrystalline Semiconductors: Materials Science and Devices. (Mater. Res. Soc. Proc. 283, Pittsburgh, PA, 1993), p.841.Google Scholar
8. Majetich, S. A., Scott, J. H., Dougherty, S., and Amster, J. (unpublished).Google Scholar
9. Sachleben, J. R., Wooten, E. W., Emsley, L., Pines, A., Colvin, V. L., and Alivisatos, A. P., Chem. Phys. Lett. 198, 43 (1992).Google Scholar