Hostname: page-component-745bb68f8f-cphqk Total loading time: 0 Render date: 2025-02-04T15:26:22.309Z Has data issue: false hasContentIssue false
  • English
  • Français

Determination of Spin-Dependent Scattering Parameters of NiFe/Cu and Co/Cu Multilayers

Published online by Cambridge University Press:  15 February 2011

S.K.J. Lenczowski ,
M.A.M. Gijs ,
R.J.M. van de Veerdonk ,
J.B. Giesbers  and
W.J.M. de Jonge
S.K.J. Lenczowski
Affiliation:
Physics Dept., Eindhoven University of Technology, 5600 MB Eindhoven, The Netherlands Philips Research Laboratories, Professor Holstlaan 4, 5656 AA Eindhoven, The Netherlands
M.A.M. Gijs
Affiliation:
Philips Research Laboratories, Professor Holstlaan 4, 5656 AA Eindhoven, The Netherlands
R.J.M. van de Veerdonk
Affiliation:
Physics Dept., Eindhoven University of Technology, 5600 MB Eindhoven, The Netherlands Philips Research Laboratories, Professor Holstlaan 4, 5656 AA Eindhoven, The Netherlands
J.B. Giesbers
Affiliation:
Philips Research Laboratories, Professor Holstlaan 4, 5656 AA Eindhoven, The Netherlands
W.J.M. de Jonge
Affiliation:
Physics Dept., Eindhoven University of Technology, 5600 MB Eindhoven, The Netherlands
Get access

Abstract

We present magnetoresistance (MR) data of high-vacuum magnetron sputtered NiFe/Cu multilayers (NiFe=Ni80Fe20) grown on Si(100) substrates with a Cu buffer layer and compare these with earlier results on Co/Cu(100) multilayers [1]. Measured MR values are directly proportional to the antiferromagnetically coupled fraction in the multilayers. Extrapolating to full antiparallel alignment, we can make a reliable comparison of the MR with the magnetoresistance model of Levy, Zhang, and Fert [2,3]. For the NiFe/Cu multilayers the deduced spin-asymmetry parameters are for interface and bulk scattering, respectively. Although much smaller than in our Co/Cu multilayers, , it is still the spin dependence of the interface scattering that is the main cause for the large MR values.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 384: Symposium L – Magnetic Ultrathin films, Multilayers and Surfaces , 1995 , 341
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Lenczowski, S. K. J., Gijs, M. A. M., Giesbers, J. B., van de Veerdonk, R. J. M., and Jonge, W. J. M. de, Phys. Rev. B 50, 9982 (1994).Google Scholar
[2] Levy, P. M., Zhang, S., and Fert, A., Phys. Rev. Lett. 65, 1643 (1990).Google Scholar
[3] Zhang, S., Levy, P. M., and Fert, A., Phys. Rev. B 45, 8689 (1992).Google Scholar
[4] Proceedings of the International Symposium on Magnetic Ultrathin Filmns, Multilayers and Surfaces, 7-10 September 1992, Lyon [J. Magn. Magn. Mater. 121(1-3) (1993)].Google Scholar
[5] Magnetic Ultrathin Films: Multilayers and Surfaces, Interfaces and Characterization, MRS Symposium Proceedings Volume 313 edited by Jonker, B. T. et al. (Materials Research Society, Pittsburgh, 1993).Google Scholar
[6] Proceedings of the MMM Conference, 15-19 November 1993, Minneapolis [J. Appl. Phys. 75(10-II) (1994)].Google Scholar
[7] Bland, J. A. C. and Heinrich, B., eds., Ultrathin Magnetic Structures I and II (Springer, Berlin Heidelberg, 1994).Google Scholar
[8] Camley, R. E. and Barnaś, J., Phys. Rev. Lett. 63, 664 (1989).Google Scholar
[9] Barthélémy, A. and Fert, A., Phys. Rev. B 43, 13124 (1991).Google Scholar
[10] Johnson, B. L. and Camley, R. E., Phys. Rev. B 44, 9997 (1991).Google Scholar
[11] Dieny, B., Europhys. Lett. 17, 261 (1992).Google Scholar
[12] Dieny, B., J. Phys. Condens. Matter 4, 8009 (1992).Google Scholar
[13] Rijks, T. G. S. M., Coehoorn, R., and de Jonge, W. J. M., Mat. Res. Soc. Symp. Proc. Vol. 313, 283 (1993).Google Scholar
[14] Falicov, L. M. and Hood, R. Q., J. Magn. Magn. Mater. 121, 362 (1993).Google Scholar
[15] Duvail, J. L., Fert, A., Pereira, L. G., and Lottis, D. K., J. Appl. Phys. 75, 7070 (1994).Google Scholar
[16] Dieny, B., Speriosu, V. S., Nozibres, J. P., Gurney, B. A., Vedyayev, A., and Ryzhanova, N., in Magnetism and Structure in Systems of Reduced Dimension, Vol. 309 of NATO Advanced Study Institute, Series B: Physics edited by Farrow, R. F. C. et al. . (Plenum, New York, 1993), p. 279.Google Scholar
[17] Gijs, M. A. M. and Okada, M., Phys. Rev. B 46, 2908 (1992).Google Scholar
[18] Gijs, M. A. M. and Okada, M., J. Magn. Magn. Mater. 113, 105 (1992).Google Scholar
[19] Parkin, S. S. P., Appl. Phys. Lett. 61, 1358 (1992).Google Scholar
[20] Speriosu, V. S., Nozières, J. P., Gurney, B. A., Dieny, B., Huang, T. C., and Lefakis, H., Phys. Rev. B 47, 11579 (1993).Google Scholar
[21] Yang, Q., Holody, P., Loloee, R., Henry, L. L., Pratt, W. P. Jr, Schroeder, P. A., and Bass, J., Phys. Rev. B 51, 3226 (1995).Google Scholar
[22] Schroeder, P. A., Bass, J., Holody, P., Lee, S.-F., Loloee, R., Pratt, W. P. Jr, and Yang, Q., Mat. Res. Soc. Symp. Proc. Vol. 313, 47 (1993).Google Scholar
[23] T. Rijks, G. S. M., Sour, R. L. H., Neerinck, D. G., Veirman, A. E. M. De, Coehoorn, R., Kools, J. C. S., Gillies, M. F., and Jonge, W. J. M. de, IEEE Trans. Magn. (1995), to be published.Google Scholar