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Published online by Cambridge University Press: 10 February 2011
We characterize, via selected area electron diffraction and high resolution TEM, the multistage crystallization process by which strontium bismuth tantalate(SBT) thin films are transformed from initial amorphous phase to the fully formed layer-structured perovskite. During the annealing process at 800°C, we found that an intermediate fluorite-like stage is formed after 3min as the SBT precursor crystallizing into the final SBT structure. This new information will be very important for formation and crystallization of ferroelectric SBT films.