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Cross-Sectional and Plan-View Observation of Cracks Introduced in Si at the Ductile-Brittle Transition Temperature

Published online by Cambridge University Press:  15 February 2011

Suprijadi  and
H. Saka
Suprijadi
Affiliation:
Department of Quantum Engg, Nagoya University, Nagoya, Japan, [email protected]
H. Saka
Affiliation:
Department of Quantum Engg, Nagoya University, Nagoya, Japan, [email protected]
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Abstract

Mode I cracks introduced in Si at the ductile-brittle transition temperature (DBTT) have been examined extensively using transmission electron microscopy. Cross-sectional as well as plane-view specimens suitable for the observation were prepared using a focused ion beam technique. Many small dislocation loops nucleate at the fracture surface of a mode I crack during the propagation at DBTT.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 539: Symposium M – Fracture & Ductile vs. Brittle Behavior - Theory, Modelling… , 1998 , 169
Copyright
Copyright © Materials Research Society 1999

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