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Copper-Indium-Boron-Diselenide Absorber Materials

Published online by Cambridge University Press:  01 February 2011

Natale J. Ianno
Affiliation:
[email protected], University of Nebraska-Lincoln, Elec. Eng., 209N WSEC, Lincoln, NE, 68588-0511, United States, 402-472-1965, 402-472-4732
Rodney J. Soukup
Affiliation:
[email protected], University of Nebraska-Lincoln, Dept. of Elec. Eng., 209N WSEC, Lincoln, NE, 68588-0511, United States
Tobin Santero
Affiliation:
[email protected], University of Nebraska-Lincoln, Dept. of Elec. Eng., 209N WSEC, Lincoln, NE, 68588-0511, United States
Chad Kamler
Affiliation:
[email protected], University of Nebraska-Lincoln, Dept. of Elec. Eng., 209N WSEC, Lincoln, NE, 68588-0511, United States
James Huguenin-Love
Affiliation:
[email protected], University of Nebraska-Lincoln, Dept. of Elec. Eng., 209N WSEC, Lincoln, NE, 68588-0511, United States
Scott A. Darveau
Affiliation:
[email protected], University of Nebraska at Kearney, Dept. of Chemistry, 905 West 25th Street, Kearney, NE, 68849-1150, United States
Jiri Olejnicek
Affiliation:
[email protected], University of Nebraska at Kearney, Dept. of Chemistry, 905 West 25th Street, Kearney, NE, 68849-1150, United States
Christopher L. Exstrom
Affiliation:
[email protected], University of Nebraska at Kearney, Dept. of Chemistry, 905 West 25th Street, Kearney, NE, 68849-1150, United States
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Abstract

Attempts to fabricate new CuIn1-xBxSe2 (CIBS) and CuBSe2 (CBS) thin-film materials have been complicated by the formation of interfering crystallites and by the loss of boron from the magnetron sputtered precursor alloys during the selenization and annealing processes. Raman and Auger spectroscopic analysis as well as x-ray diffraction studies show that the formation of boron selenide may be contributing to the difficulty in creating these new materials.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

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