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The Control of Electronic States Spreading Outside the Conjugated Polymer Surface

Published online by Cambridge University Press:  26 February 2011

Xiao Tao Hao ,
Takuya Hosokai ,
Noritaka Mitsuo ,
Satoshi Kera ,
Kazuyuki Sakamoto ,
Koji Kamiya Okudaira  and
Nobuo Ueno
Xiao Tao Hao
Affiliation:
[email protected], Chiba University, Faculty of Engineering, 1-33 Yayoi-cho, Inage-ku,, Chiba, 263-8522, Japan
Takuya Hosokai
Affiliation:
[email protected], Chiba University, Graduate School of Science and Technology,, Chiba, 263-8522, Japan
Noritaka Mitsuo
Affiliation:
[email protected], Chiba University, Graduate School of Science and Technology,, Chiba, 263-8522, Japan
Satoshi Kera
Affiliation:
[email protected], Chiba University, Graduate School of Science and Technology,, Chiba, 263-8522, Japan
Kazuyuki Sakamoto
Affiliation:
[email protected], Chiba University, Faculty of Engineering, 1-33 Yayoi-cho, Inage-ku,, Chiba, 263-8522, Japan
Koji Kamiya Okudaira
Affiliation:
[email protected], Chiba University, Faculty of Engineering, 1-33 Yayoi-cho, Inage-ku,, Chiba, 263-8522, Japan
Nobuo Ueno
Affiliation:
[email protected], Chiba University, Faculty of Engineering, 1-33 Yayoi-cho, Inage-ku,, Chiba, 263-8522, Japan
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Abstract

The surface electronic structures of conjugated regio regular and regio random poly (3- hexylthiophene) (rr-P3HT and rra-P3HT) thin films were studied by near edge X-ray absorption fine structure spectroscopy, ultraviolet photoelectron spectroscopy and Penning ionization electron spectroscopy (PIES). The distribution of the surface electronic states was controlled on rr-P3HT and rra-P3HT thin films with different molecular ordering by varying the coating process and PIES was adopted to observe the electronic states existing outside the surface.

Keywords

polymerelectronic structuresolvent casting
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 965: Symposium S – Organic Electronics – Materials, Devices and Applications , 2006 , 0965-S13-02
Copyright
Copyright © Materials Research Society 2007

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References

REFERENCES

1. Sirringhaus, H., Brown, P.J., Friend, R.H., Nielsen, M.M., Bechgaard, K., Langeveld-Voss, M.M.W., Spiering, A.J.H., Janssen, R.A.J., Meijer, E.W., Herwig, P., Leeuw, D.M., Nature, 401, 685(1999).Google Scholar
2. Hao, X.T., Hosokai, T., Mitsuo, N., Kera, S., Mase, K., Okudaira, K.K., Ueno, N., Appl. Phys. Lett. 89, 182113(2006).Google Scholar
3. McCullough, R.D., Adv. Mater. 10, 93 (1998).Google Scholar
4. Jiang, X.M., österbacka, R., Korovyanko, O., An, C.P., Horovitz, B., Jansen, R.A.J., Vardeny, Z. V., Adv. Funct. Mater. 12, 587(2002).Google Scholar
5. Salaneck, W.R., Inganäs, O., Thémans, B., Nilsson, J.O., Sjögren, B., Österholm, J.E., Brèdas, J.L., Svensson, S., J. Chem. Phys. 89, 4613(1988).Google Scholar
6. Cascio, A.J., Lyon, J. E., Beerbom, M. M., Schlaf, R., Zhu, Y., and Jenekhe, S.A., Appl. Phys. Lett. 88, 062104 (2006).Google Scholar
7. Kim, D.H., Jang, Y., Park, Y.D., and Cho, K., Langmuir 21, 3203 (2005).Google Scholar
8. Harada, Y., Masuda, S., Ozaki, H., Chem. Rev. 97, 1987(1997).Google Scholar
9. Okudaira, K.K., Kera, S., Setoyama, H., Morikawa, E., Ueno, N., J. Electron Spectros. Relat. Phenom. 121, 225 (2001).Google Scholar
10. Kera, S., Setoyama, H., Kimura, K., Iwasaki, A., Okudaira, K.K., Harada, Y., Ueno, N., Surf. Sci. 482–485, 1192 (2001).Google Scholar
11. Yasufuku, H., Meguro, K., Akatsuka, S., Setoyama, H., Kera, S., Azuma, Y., Okudaira, K.K., Hasegawa, S., Harada, Y. and Ueno, N., Jpn. J. Appl. Phys. 39, 1706 (2000).Google Scholar
12. Delongchamp, D.M., Vogel, B.M., Jung, Y., Gurau, M.C., Richter, C. A., Kirillov, O.A., Obrzut, J., Fisher, D.A., Sambasivan, S., Richter, L.J., and Lin, E.K., Chem. Mater. 17, 5610 (2005).Google Scholar
13. Patnaik, A., Okudaira, K.K., Setoyama, H., Mase, K., and Ueno, N., J. Chem. Phys. 122, 154703 (2005).Google Scholar