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A Comparison of Electron Energy Loss Spectroscopy and Electron Diffraction for Polycrystalline and Xe+ Irradiated Nickel Silicides

Published online by Cambridge University Press:  22 February 2011

J.C. Barbour ,
L.A. Grunes  and
J.W. Mayer
J.C. Barbour
Affiliation:
Materials Science, Bard Hall, Cornell University, Ithaca, NY 14853,
L.A. Grunes
Affiliation:
Xerox Webster Research Center - W114, Webster, NY 14580
J.W. Mayer
Affiliation:
Materials Science, Bard Hall, Cornell University, Ithaca, NY 14853,
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Abstract

Variations in the valence and core level electron energy loss spectroscopy (EELS) peaks are studied as a function of nickel silicide composition.Analysis of the EELS spectra in comparison with the electron diffraction patterns show the plasmon energies fingerprint the silicide phases. The EELS core level spectra reflect the Si bonding and the electronic density of states in each phase.Irradiated Ni 2Si becomes amorphous causing a change in the plasmon peak energy and the Si L23peaks.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 25: Symposium C – Thin Films and Interfaces II , 1983 , 235
Copyright
Copyright © Materials Research Society 1984

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References

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