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Comparison of APCVD to LPCVD Processes in the Manufacturing of ZnO TCO for Solar Applications

Published online by Cambridge University Press:  31 January 2011

Wei Zhang
Affiliation:
[email protected], CVD Equipment Corp., CVD Applications Laboratory, Ronkonkoma, New York, United States
tom salagaj
Affiliation:
[email protected], CVD Equipment Corp., CVD Application Laboratory, Ronkonkoma, New York, United States
Jiuan Wei
Affiliation:
[email protected], CVD Equipment Corp., CVD Application Laboratory, Ronkonkoma, New York, United States
christopher jensen
Affiliation:
[email protected], United States
karlheinz strobl
Affiliation:
[email protected], United States
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Abstract

A FirstNano EasyTube 3000 CVD system with a 3” diameter horizontal tube furnace was used to investigate the optimization of both APCVD (Atmospheric Pressure Chemical Vapor Deposition) and LPCVD (Low Pressure Chemical Vapor Deposition) processes to grow both boron and fluorine doped ZnO films with a sheet resistance, slice resistance and haze suitable for their potential utilizations as TCO (Transparent Conductive Oxide) layers for photovoltaic applications. Growth rates as high as 100 nm per minute have been obtained in some parameter regions for both processes. In both cases the resulting material property parameters were the same or better than reported in the literature. Although the horizontal hot wall CVD R&D reactor is not optimum for uniform TCO thin film deposition it allowed us to investigate the interrelationship of the most critical parameters with the resulting material properties.

The driving force for this work is the ultimate goal of demonstrating a process parameter solution suggesting that ZnO films (usable for either display system manufacturing and/or photovoltaic applications) can be deposited with optimized material properties that are comparable to LPCVD or sputtering processes, but that the APCVD solution could be more economical for large scale thin film ZnO coating implementation. Ultimately our desire is to transfer such a ZnO deposition process to our proprietary, APCVD CVDgCoat™ platform, which has the ability to coat up to 4 meter wide glass sheets and metal foils.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

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References

[1]. Liang, H, Gordon, RG (2007) J Mater Sci 42:63886399 10.1007/s10853-006-1255-5Google Scholar
[2]. Hu, J, Gordon, RG (1991) Solar Cells 30:437 10.1016/0379-6787(91)90076-2Google Scholar
[3]. Hu, J, Gordon, RG (1992) J Appl Phys 71:880 10.1063/1.351309Google Scholar
[4]. Fay, S et al. (2005) Solar Energy Materials & Solar Cells 86: 385397, 39210.1016/j.solmat.2004.08.002Google Scholar
[5]. Hu, J, Gordon, RG (1992) J Electrochem Soc 139:2014 10.1149/1.2221166Google Scholar
[6]. Sato, H, Minami, T, Miyata, T, Ishii, M (1994) Thin Solid Films 246:65 10.1016/0040-6090(94)90733-1Google Scholar
[7]. Minami, T, Sato, H, Imamoto, H, Takata, S (1992) Jpn J Appl Phys Google Scholar
[8]. Minami, T, Sato, H, Sonohara, H, Takata, S, Miyata, T, Fukuda, I (1994) Thin Solid Films 253:14 10.1016/0040-6090(94)90286-0Google Scholar
[9]. Hu, J, Gordon, RG (1992) J Appl Phys 72:5381 10.1063/1.351977Google Scholar
[10]. Hirata, GA, McKittric, J, Cheeks, T, Siqueiros, JM, Diaz, JA, Contreras, O, Lopez, OA (1996) Thin Solid Films 288:29 10.1016/S0040-6090(96)08862-1Google Scholar
[11]. Wang, R, King, LLH, Sleight, A (1996) J Mater Res 11:1659 10.1557/JMR.1996.0208Google Scholar
[12]. Haga, K, Kamidaira, M, Kashiwaba, Y (2000) J. Crystal Growth 214:7780.10.1016/S0022-0248(00)00068-3Google Scholar
[13]. Roth, A. P., Williams, D. F. (1981) J. Appl. Phys. 52/11:66856692.10.1063/1.328618Google Scholar
[14]. Takahashi, K., Omura, A., Konagai (1996) Patent No US5545443.Google Scholar
[15]. Zhang, W, Salagaj, T, Jensen, C, Strobl, K, Davies, M, 2009 Materials Research Society (MRS) Fall Meeting, Nov. 30-Dec. 4, 2009 Boston, MA, U.S.A (in press)Google Scholar