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Combined AFM-SEM testing for mechanical property determination of graphene oxide paper

Published online by Cambridge University Press:  21 February 2012

Congwei Wang  and
Asa H. Barber
Congwei Wang
Affiliation:
Department of Materials, School of Engineering and Materials Science, Queen Mary University of London, Mile End Road, London E1 4NS, U.K.
Asa H. Barber
Affiliation:
Department of Materials, School of Engineering and Materials Science, Queen Mary University of London, Mile End Road, London E1 4NS, U.K.
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Abstract

A novel technique combining both atomic force microscopy (AFM) and scanning electron microscopy (SEM) is used to test the mechanical properties of densely-packed graphene oxide (GO) paper. Individual beams of GO paper with variable widths were prepared using focussed ion beam (FIB) microscopy and tensile tested to failure using the AFM while observing with SEM. A variation in the tensile strength of the GO paper beams up to 64.8 MPa was recorded in the vacuum testing condition. An increase in breaking stress of GO paper with decreasing sample width was determined and proposed as being due to fewer defects present in GO beams of smaller width.

Keywords

ion-beam processingnanostructurefracture
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1407: Symposium AA – Carbon Nanotubes, Graphene and Related Nanostructures , 2012 , mrsf11-1407-aa10-77
Copyright
Copyright © Materials Research Society 2012

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