No CrossRef data available.
Article contents
Charge Injection into Bottom-Contact Pentacene Thin-Film Transistors
Published online by Cambridge University Press: 01 February 2011
Abstract
We investigate the contact of bottom-contact pentacene-based thin-film transistors, with Au source/drain electrode. By separating the voltage drop at the contact from the source-drain voltage, the current-voltage characteristic of the injection contact is obtained. The contact characteristics are in a good agreement with a model of carrier injection from a metal electrode into a disordered hopping system.
- Type
- Research Article
- Information
- Copyright
- Copyright © Materials Research Society 2006
References
1
Nichols, J. A., Gundlach, D. J., and Jackson, T. N., Appl. Phys. Lett.
83, 2366 (2003).Google Scholar
2
Puntambekar, K. P., Pesavento, P. V., and Frisbie, C. D., Appl. Phys. Lett.
83, 5539 (2003).Google Scholar
3
Burgi, L., Richards, T. J., Friend, R. H., and Sirringhaus, H., J. Appl. Phys.
94, 6129 (2003).Google Scholar
5
Necliudov, P. V., Shur, M. S., Gundlach, D. J., and Jackson, T. N., Solid-State Electron.
47, 259 (2003).Google Scholar
6
Pesavento, P. V., Chesterfield, R. J., Newman, C. R., and Frisbie, C. D., J. Appl. Phys.
96, 7312 (2004).Google Scholar
8
Li, T., Ruden, P. P., Campbell, I. H., and Smith, D. L., J. Appl. Phys.
93, 4017 (2003).Google Scholar
9
Kymissis, I., Dimitrakopoulos, C. D., and Purushothaman, S., IEEE Trans. Electron. Dev.
48, 1060 (2001).Google Scholar
13
Arkhipov, V. I., Emelianova, E. V., Tak, Y. H., and Bassler, H., J. Appl. Phys.
84, 848 (1998).Google Scholar
15
Reynaert, J., Arkhipov, V. I., Borghs, G., and Heremans, P., Appl. Phys. Lett.
85, 603 (2004).Google Scholar