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Characterization of High Temperature Superconducting Thin Film Grown by Laser Ablation Method

Published online by Cambridge University Press:  28 February 2011

K. Shimizu ,
H. Nobumasa ,
N. Nagai ,
T. Matsunobe  and
T. Kawai
K. Shimizu
Affiliation:
Toray Ind. Inc., 2–1, Sonoyama 3-chome, Otsu, Shiga 520 Japan
H. Nobumasa
Affiliation:
Toray Ind. Inc., 2–1, Sonoyama 3-chome, Otsu, Shiga 520 Japan
N. Nagai
Affiliation:
Toray Research Center Inc., 1-–1, Sonoyama 3-chome, Otsu, Shiga 520 Japan
T. Matsunobe
Affiliation:
Toray Research Center Inc., 1-–1, Sonoyama 3-chome, Otsu, Shiga 520 Japan
T. Kawai
Affiliation:
Osaka University, Ibaraki, Osaka 567, Japan
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Abstract

We have measured the complex dielectric function of BizSr2Ca1Cu2Ox samples in the near infrared region directly by spectroellipsometry. As for both single crystal and thin film, superconducting samples have a zero point in the real part (ε1) of the complex dielectric function (ε*) and a clear peak of the imaginary part of the inverse ε* at almost the same frequency. On the other hand, non-superconducting samples have no such ei zero point, and the peak height of (-Im(1/ε*)) becomes small. Then we can determine the superconductivity of samples by this spectroellipsometry measurement at room temperature.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 235: Symposium A – Phase Formation and Modification by Beam-Solid Interactions , 1991 , 861
Copyright
Copyright © Materials Research Society 1992

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References

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