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Characterization of High Temperature Superconducting Thin Film Grown by Laser Ablation Method

Published online by Cambridge University Press:  25 February 2011

K. Shimizu ,
H. Nobumasa ,
N. Nagai ,
T. Matsunobe  and
T. Kawai
K. Shimizu
Affiliation:
Toray Ind.Inc., 2-l.Sonoyama 3-chome, Otsu, Shiga 520, Japan
H. Nobumasa
Affiliation:
Toray Ind.Inc., 2-l.Sonoyama 3-chome, Otsu, Shiga 520, Japan
N. Nagai
Affiliation:
Toray Research Center Inc., 1-1, Sonoyama 3-chome, Otsu, Shiga 520, Japan
T. Matsunobe
Affiliation:
Toray Research Center Inc., 1-1, Sonoyama 3-chome, Otsu, Shiga 520, Japan
T. Kawai
Affiliation:
Osaka University, Ibaraki, Osaka 567, Japan
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Abstract

We have measured the complex dielectric function of Bi2Sr2CaCu2Oy, samples in the near infrared region directly by spectroellipsometry. As for both single crystal and thin film. superconducting samples have a zero point in the real part (ε1) of the complex dielectric function (ε*) and a clear peak of the imaginary part of the inverse ε* at almost the same frequency. On the other hand, non-superconducting samples have no such ε1, zero point, and the peak height of (-Im(l/ε*)) becomes small. Then we can determine the superconductivity of samples by this spectroellipsometry measurement at room temperature.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 236: Symposium B – Photons and Low Energy Particles in Surface Processing , 1991 , 449
Copyright
Copyright © Materials Research Society 1992

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References

[1] Bozovic, I.,Phys.Rev. B42,1969(1990).Google Scholar
[2] Tajima, S.,S.Uchida.H.Ishii,H.Takagi, and Tanaka, S., Modern Phys.Lett. 1,353(1988).CrossRefGoogle Scholar
[3] Schlesinger, Z., Collins, R.T., Kriser, D.L., and Holzerg, F., Phys.Rev.Lett. 59,1958(1987).CrossRefGoogle Scholar
[4] Thomas, G.A., Orenstein, J., Rapkine, D.H., Capizzi, M., Millis, A.J., BhattL, R.N..Schneemeyer, F., and Waszczak, J.V., Phys.Rev.Lett. 61,1313(1988).CrossRefGoogle Scholar
[5] Etemad, S., Aspnes, D.E., Kelly, M.K., Thompson, R., Tarascon, J.M., and Hull, G.W., Phys.Rev. B37,3396(1988).Google Scholar
[6] Shimizu, K. Nobumasa, H.,N.Nagai, and Kawai, T.,in proceedings of MzS-HTSCI(1991).Google Scholar