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Can We Trust on the Thermal Analysis of Metal Organic Powders for thin film preparation?

Published online by Cambridge University Press:  18 May 2012

Jordi Farjas
Affiliation:
Department of Physics, University of Girona, Girona, Catalonia, Spain.
Daniel Sanchez-Rodriguez
Affiliation:
Department of Physics, University of Girona, Girona, Catalonia, Spain.
Hichem Eloussifi
Affiliation:
Department of Physics, University of Girona, Girona, Catalonia, Spain. Laboratoire de Chimie Inorganique, Faculté des Sciences de Sfax, Route de Soukra Km 3.5 BP 1171, 3000 Sfax, Tunisia
Raul Cruz Hidalgo
Affiliation:
Department of Physics, University of Girona, Girona, Catalonia, Spain. Departamento de Física y Matemática Aplicada, Universidad de Navarra, 31080 Pamplona, Spain.
Pere Roura
Affiliation:
Department of Physics, University of Girona, Girona, Catalonia, Spain.
Susagna Ricart
Affiliation:
Institut de Ciència de Materials de Barcelona, CSIC, Bellaterra, Catalonia, Spain.
Teresa Puig
Affiliation:
Institut de Ciència de Materials de Barcelona, CSIC, Bellaterra, Catalonia, Spain.
Xavier Obradors
Affiliation:
Institut de Ciència de Materials de Barcelona, CSIC, Bellaterra, Catalonia, Spain.
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Abstract

Thermal analysis techniques are routinely applied to characterize the thermal behavior of metal organic precursors used for oxide film preparation. Since the mass of films is very low, researchers do their thermal analyses on powders and consider that the results are representative of films. We will show here that, in general, this assumption is not true. Several examples involving precursors of YBa2Cu3O7-x (Ba and Y trifluoroacetates and Ba propionate) will serve to appreciate that films can behave very differently than powders due to their enhanced heat and mass transport paths. Ultimately, we will demonstrate that, in some cases, relying on powders thermal analysis may lead to erroneous conclusions.

Type
Articles
Copyright
Copyright © Materials Research Society 2012

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References

REFERENCES

1. Schwartz, R.W., Schneller, T., Waser, R., Chemical solution deposition of electronic oxide films, C. R. Chim. 7, 433 (2004).Google Scholar
2. Farjas, J., Pinyol, A., Rath, Ch., Roura, P., and Bertran, E., Phys. Stat. Sol. A 203, 1307 (2006).Google Scholar
3. Kim, M-G., Kanatzidis, M.G, Facchetti, A. and Marks, T.J., Nature Materials 10, 382 (2011).Google Scholar
4. Roura, P. and Farjas, J., Thermochim. Acta 430, 115 (2005).Google Scholar
5. Eloussifi, H., Farjas, J., Roura, P., Camps, J., Dammak, M., Ricart, S., Puig, T. and Obradors, X., J. Therm. Anal. Calorim. DOI 10.1007/s10973-011-1899-5.Google Scholar
6. Roura, P., Farjas, J., Ricart, S., Aklalouch, M., Guzman, R., Arbiol, J., Puig, T., Calleja, A., Peña-Rodríguez, O., Garriga, M., and Obradors, X., Thin Solid Films 520, 1949 (2012).Google Scholar
7. Roura, P., Farjas, J., Camps, J., Ricart, S., Arbiol, J., Puig, T., and Obradors, X., J. Nanopart. Res. 13, 4085 (2011).Google Scholar
8. Obradors, X., Puig, T., Pomar, A., Sandiumenge, F., Mestres, N., Coll, M., Cavallaro, A., Roma, N., Gazquez, J., Gonzalez, J.C., Castano, O., Gutierrez, J., Palau, A., Zalamova, K., Morlens, S., Hassini, A., Gibert, M., Ricart, S., Moreto, J.M., Pinol, S., Isfort, D. and Bock, J., Supercond. Sci. Technol. 19, S13 (2006).Google Scholar