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Behavior of Magnetic Domains in Single Magnetic Nanowire with Shallow Trench along Length Direction Observed by Magnetic Force Microscopy

Published online by Cambridge University Press:  15 May 2013

Mitsunobu Okuda ,
Yasuyoshi Miyamoto ,
Eiichi Miyashita  and
Naoto Hayashi
Mitsunobu Okuda
Affiliation:
NHK Science & Technology Research Laboratories, 1-10-11 Kinuta, Setagaya-ku, Tokyo, 157-8510, Japan
Yasuyoshi Miyamoto
Affiliation:
NHK Science & Technology Research Laboratories, 1-10-11 Kinuta, Setagaya-ku, Tokyo, 157-8510, Japan
Eiichi Miyashita
Affiliation:
NHK Science & Technology Research Laboratories, 1-10-11 Kinuta, Setagaya-ku, Tokyo, 157-8510, Japan
Naoto Hayashi
Affiliation:
NHK Science & Technology Research Laboratories, 1-10-11 Kinuta, Setagaya-ku, Tokyo, 157-8510, Japan
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Abstract

We have proposed new magnetic memories using parallel-aligned nanowires without mechanical moving parts, in order to achieve the ultra high transfer rate of more than 144 Gbps for Super Hi-Vision TV. In the magnetic memory using nanowires, the data are stored as the magnetic domains with up or down magnetization in magnetic nanowires, and the domains are shifted quite faster by applying optimum current along the nanowire direction for data writing and reading purpose. Since the electric circuits and the insulation space between the neighbor nanowires are necessary for moving the magnetic domain walls, the areal recording density is essentially reduced as compared with that of conventional hard disk drives. In this study, in order to increase the areal recording density of magnetic nanowire memory, we have tried to act one magnetic nanowire as the virtual multiple data tracks. The shallow scratched trench was introduced using scanning probe microscopy along the length direction on the surface of a single nanowire to form multiple internal tracks, and we have succeeded in realizing a couple of virtual tracks states.

Keywords

scanning probe microscopy (SPM)magnetic propertiesnano-indentation
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1527: Symposium UU – Scanning Probe Microscopy―Frontiers in Nanotechnology , 2013 , mrsf12-1527-uu06-25
Copyright
Copyright © Materials Research Society 2013 

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References

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