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Auger Analysis of a Fiber/Matrix Interface in a Ceramic Matrix Composite

Published online by Cambridge University Press:  21 February 2011

Frank S. Honecyt  and
Stephen V. Pepper
Frank S. Honecyt
Affiliation:
Case Western Reserve University, Department of Mechanical and Aerospace Engineering, Cleveland, OH 44106 NASA Lewis Research Center, Cleveland, OH 44136
Stephen V. Pepper
Affiliation:
NASA Lewis Research Center, Cleveland, OH 44136
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Abstract

Auger electron spectroscopy (AES) with depth profiling was used to characterize the fiber/matrix interface of SIC fiber, reaction bonded Si3N4 matrix composite. Depth profiles of the “as received” double coated fiber revealed concentration oscillations which disappeared after annealing the fiber in the environment used to fabricate the composite. After the composite was fractured, the Auger depth profiles indicated that failure occurred in neither the ß-SiC fiber body nor in the Si3N4 matrix but in the fiber coating itself.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 119: Symposium F – Adhesions in Solids , 1988 , 303
Copyright
Copyright © Materials Research Society 1988

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References

[1] Bhatt, R.T., in Tailoring Multi-Phase and Composite Ceramics. MRS Vol 20, edited by Tressler, R.E., Messing, G.L., Pantarro, C.G., and Newnham, R.E. (Plenham Press, New York, 1976) p. 675.Google Scholar
[2] Maissel, L.I., in Handbook of Thin Film Technology, edited by Maissel, L.I. and Glang, R., (McGraw-Hill, New York, 1970) p 4–40.Google Scholar
[3] McGuire, G.E., Auger Electron Spectroscopy Reference Manual, (Plenum Press, New York, 1979).Google Scholar
[4] Palmberg, P.W., Riach, G.E., Weber, R.E., and Macdonald, N.C., Handbook of Auaer Electron Spectroscopy, (Physical Electronics Industries Inc., Edina, MN, 1972).Google Scholar
[5] Briggs, D., and Rivière, J.C., in Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, edited by Briggs, D. and Seah, M.P., (Wiley & Sons, New York, 1983) pp 97–104.Google Scholar
[6] Bhatt, R.T. (private communication).Google Scholar
[7] Wagner, C., J. Appl. Phys., 29, 1295, (1958); Corros. Sci., 5, 751, (1965).Google Scholar