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Atomistic Calculation of Stability and Metastability of Coherently Strained Silicon-Like Structures
Published online by Cambridge University Press: 26 February 2011
Abstract
Monte Carlo based microscopic techniques were used to study the stability and metastability of thin coherently strained layers of mismatched siliconlike semiconductor material grown on the (111) silicon surface. The structural energy was calculated using three-body empirical potentials. For layers greater than about 20 Å thickness, the critical layer thickness associated with thermodynamic stability agrees quantitatively with continuum theory. For thinner layers, however, considerable variations from the continuum theory are found. For a strained layer six monolayers thick, the test system is found to be metastable against the nucleation of misfit dislocations to a lattice mismatch of about 11%, compared to the 4% equilibrium stability limit.
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