Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-08T01:23:19.972Z Has data issue: false hasContentIssue false

Assessment of Microwave Permittivity for Detecting Fruit Maturity

Published online by Cambridge University Press:  15 February 2011

Stuart O. Nelson
Affiliation:
U. S. Department of Agriculture, Agricultural Research Service, Richard B. Russell Agricultural Research Center, P. O. Box 5677, Athens, GA 30613
W. Roy Forbus Jr
Affiliation:
U. S. Department of Agriculture, Agricultural Research Service, Richard B. Russell Agricultural Research Center, P. O. Box 5677, Athens, GA 30613
Kurt C. Lawrence
Affiliation:
U. S. Department of Agriculture, Agricultural Research Service, Richard B. Russell Agricultural Research Center, P. O. Box 5677, Athens, GA 30613
Get access

Abstract

Permittivity measurements from 0.2 to 20 GHz were taken on fresh peaches of three varieties at three stages of maturity during the growing season to determine whether dielectric properties might be correlated with maturity. Other physical properties of the peach tissue, such as density, moisture content, firmness, and total soluble solids content, were also determined. Two indices, based on dielectric constant and loss factor values at 0.2 and 10 GHz were found to correlate with stage of maturity, but they were dependent on the variety, and further study is necessary to determine their practical usefulness.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Nelson, S. O., Trans. ASAE 23, 13141317 (1980).Google Scholar
2. Nelson, S. O., Forbus, W. R. Jr, and Lawrence, K. C., ASAE Paper No. 933079 (Amer. Soc. Agrie. Engrs., St. Joseph, MI, 1993).Google Scholar
3. Forbus, W. R. Jr, and Dull, G. G., J. Food Sci. 55, 15811584 (1990).Google Scholar
4. Stuchly, M. A. and Stuchly, S. S., IEEE Trans. Instrum. Meas. IM–24, 176183 (1980).Google Scholar
5. Athey, T. W., Stuchly, M. A., and Stuchly, S. S., IEEE Trans. Microwave Theory Tech. MTT–30, 8292 (1982).Google Scholar
6. Kraszewski, A., Stuchly, M. A., and Stuchly, S. S., IEEE Trans. Instrum. Meas. IM–32, 385387 (1983).Google Scholar
7. Kraszewski, A., Stuchly, S. S., Stuchly, M. A., and Symons, S. A., IEEE Trans. Instrum. Meas. IM–32, 3742 (1983).Google Scholar
8. Grant, J. P., Clarke, R. N., Symm, G. T., and Spyrou, N. M., J. Phys. E: Sci. Instrum. 22, 757770 (1989).Google Scholar
9. Misra, D. M., Chabbra, M., Epstein, B. R., Mirotznik, M., and Foster, K. R.. IEEE Trans. Microwave Theory Tech. MTT–38, 814 (1990).Google Scholar
10. Xu, Y., Bosisio, R. G., and Bose, T. K., IEE Proc.-H 138, 356360 (1991).Google Scholar