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Published online by Cambridge University Press: 25 February 2011
The conventional method for fabricating silicon IMPATT diode structures involves the epitaxial growth of successive n- and p-type layers onto a n+ substrate followed by a boron diffusion to form the final p+ layer. The high temperature time cycles experienced by the structure during these processes cause junction interfaces to become degraded through dopant diffusion. In this paper we examine the application of laser processing techniques to the epitaxial regrowth of low temperature deposited layers and report on the nature of the recrystallised material.