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Anisotropy in the Phonon Dispersion Relations of Graphite and Carbon Nanotubes Measured by Raman Spectroscopy

Published online by Cambridge University Press:  11 February 2011

Georgii G. Samsonidze
Affiliation:
Department of Electrical Engineering and Computer Science
Riichiro Saito
Affiliation:
Department of Electronic Engineering, University of Electro-Communications CREST JST, Tokyo 182–8585, Japan
Ado Jorio
Affiliation:
Department of Physics Departamento de Física, Universidade Federal de Minas Gerais, Belo Horizonte, MG 30123–970, Brazil
Antonio G. Souza Filho
Affiliation:
Department of Physics Departamento de Física, Universidade Federal do Ceará, Fortaleza, CE 60455–760, Brazil
Alexander Grüneis
Affiliation:
Department of Electronic Engineering, University of Electro-Communications
Marcos A. Pimenta
Affiliation:
Departamento de Física, Universidade Federal de Minas Gerais, Belo Horizonte, MG 30123–970, Brazil
Gene Dresselhaus
Affiliation:
Francis Bitter Magnet Laboratory, Massachusetts Institute of Technology, Cambridge, MA 02139–4307, U.S.A.
Mildred S. Dresselhaus
Affiliation:
Department of Electrical Engineering and Computer Science Department of Physics
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Abstract

The possible semiconducting device use of single wall carbon nanotubes (SWNTs) requires a technique for the determination of the exact structure of the nanotubes assembled in the device configuration. Raman spectroscopy has been established as a precise and non-destructive tool for the characterization of graphitic nanostructures. Double resonance theory, which is used to explain the dispersive nature of the Raman bands, has attracted much attention for its potential use for the characterization of the electronic and phonon spectra of these nanostructures. Dispersive features in the Raman spectra of low dimensional graphitic materials, such as carbon nanotubes, can be used to measure directly the anisotropy, or the trigonal warping effect, in the phonon dispersion relations about the hexagonal corner of the Brillouin zone (BZ) of graphite.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

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References

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