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Analysis of the Front Facet Temperature in Laser Diode With Non Absorbing Mirror

Published online by Cambridge University Press:  01 February 2011

Tomasz Jan Ochalski
Affiliation:
[email protected], Institute of Electron Technology, Al. Lotnikow 32/46, Warszawa, N/A, 02-668, Poland
Dorota Pierscinska
Affiliation:
[email protected], Institute of Electron Technology, Poland
Andrzej Malag
Affiliation:
[email protected], Institute of Electronic Materials Technology, Poland
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Abstract

Non-absorbing mirror (NAM) lasers, also known as window lasers, were developed to increase catastrophic optical damage level of the devices. In this work we present the analysis of the laser diodes (LD) front facet temperature distribution. Micro-thermoreflectance technique is used to perform a detailed temperature maps of the operating LDs. Such a technique gives us temperature maps with a high spatial resolution equal 0.6μm. We demonstrate micro thermoreflectance as a perfect tool to determine real temperature distribution of the operating laser diode front facet.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

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References

REFERENCES

1 Botez, D. and Connolly, J.C., Electron. Lett. 20, 530 (1984).Google Scholar
2 Epperlein, P. W., Bona, G. L., and Roentgen, P., Appl. Phys. Lett. 60, 680 (1992).Google Scholar
3 Todoroki, S., Sawai, M., and Aiki, K., J. Appl. Phys. 58, 1124 (1985).Google Scholar
4 Brugger, H. and Epperlein, P. W., Appl. Phys. Lett. 56, 1049 (1990).Google Scholar
5 Wawer, D., Ochalski, T. J., Piwoński, T., Wójcik-Jedlińska, A., Bugajski, M., Page, H., Phys. Stat. Sol. (a) 7, 1227 (2005).Google Scholar
6 Tomm, J.W., Strelchuk, V., Gerhardt, A., Zeimer, U., Zorn, M., Kissel, H., Weyers., M., J. Appl. Phys., 95, 1122 (2004).Google Scholar
7 Rinner, F., Rogg, J., Kelemen, M. T., Mikulla, M., Weimann, G., Tomm, J. W., Thamm, E., Poprawe., R., J. Appl. Phys., 93, 1848 (2003).Google Scholar