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Analysis of HgI2 And PbI2 Crystals and Detectors by Particle-Induced X-Ray Emission (PIXE) and Ion Backscattering Spectroscopy (IBS)

Published online by Cambridge University Press:  21 February 2011

G. S. Bench ,
A. J. ANTOLAK ,
D. H. MORSE ,
D. W. HEIKKINEN ,
A. E. PONTAU ,
R. B. JAMES ,
D. C. DAVID ,
A. BURGER  and
L. VAN DEN BERG
G. S. Bench
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA 94550
A. J. ANTOLAK
Affiliation:
Sandia National Laboratories, Livermore, CA 94551
D. H. MORSE
Affiliation:
Sandia National Laboratories, Livermore, CA 94551
D. W. HEIKKINEN
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA 94550
A. E. PONTAU
Affiliation:
Sandia National Laboratories, Livermore, CA 94551
R. B. JAMES
Affiliation:
Sandia National Laboratories, Livermore, CA 94551
D. C. DAVID
Affiliation:
Sandia National Laboratories, Livermore, CA 94551
A. BURGER
Affiliation:
Fisk University, Nashville, TN 37208
L. VAN DEN BERG
Affiliation:
EG&G Energy Measurements, Goleta, CA 93116
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Abstract

The Ion Micro-Analysis Group (IMAG) in Livermore conducts quantitative trace elemental analysis with PIXE and depth profiling with IBS using an MeV ion microbeam. The system has the capability to produce two-dimensional trace element and IBS images. PIXE analyses have been conducted on HgI2 and PbI2 crystals and detector materials in order to identify and quantify near surface trace contaminants. IBS measurements have been conducted to investigate elemental depth distributions in various materials. The results of measurements on several different samples are reported and a discussion of factors affecting quantitative in vacuo microanalysis of these materials is presented.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 302: Symposium F – Semiconductors for Room-Temperature Radiation Detector Applications , 1993 , 67
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1. Johansson, S. A. E. and Campbell, J. L., PIXE A Novel Technique for Elemental Analysis, (John Wiley and Sons, Chichester, 1988).Google Scholar
2. Bird, J. R. and Williams, J. S., Ion Beams for Materials Analysis, (Academic Press, Sydney, 1989).Google Scholar