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X-Ray Fluorescence Analysis Capability of HGI2 Detector Systems

Published online by Cambridge University Press:  21 February 2011

Y.J. Wang
Affiliation:
Xsirius, Inc., 4640 Admiralty Way, Suite 214, Marina del Rey, CA 90292
J.S. IWANCZYK
Affiliation:
Xsirius, Inc., 4640 Admiralty Way, Suite 214, Marina del Rey, CA 90292
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Abstract

A laboratory XRF analysis system employing an HgI2 spectrometer detector has been built. The system consists of an x-ray generator tube, a rotating carousel holding multiple XRF targets, and a probe head containing the HgI2 detector. Tests have been performed on several samples, under vacuum, helium and nitrogen ambient atmospheric conditions. This is of particular interest, since the applications for such an XRF system include operation under different ambient conditions. For applications in terrestrial and space planetary exploration, the expected temperatures and gas ambient will vary widely. Comparative analyses using the various gases were made on spectra obtained from standard geological samples.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

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References

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