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X-Ray Analysis of Alpha Mercuric Iodide Crystal Structure and Processing Effects*

Published online by Cambridge University Press:  21 February 2011

L. Keller ,
E.X. Wang  and
A.Y. Cheng
L. Keller
Affiliation:
CAMET Research, Inc., Goleta, CA 93117
A.Y. Cheng
Affiliation:
EG&G Energy Measurements Inc., Santa Barbara Operations, Goleta, CA 93117
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Abstract

X-ray topography and rocking curve experiments were performed on α-mercuric iodide samples. As-grown crystals were examined for intrinsic defects and crystallinity. Orientation of certain defects depends on the direction of crystal growth. The propagation of as-grown crystalline features was documented. The extent of crystal damage introduced during various steps of device fabrication such as sawing, polishing, etching and contact deposition was explored. Coefficients of linear thermal expansion of α33 = 54 ± 5 (10−6/°C) along the tetragonal c-axis, \001] direction and ±ll = 11 ± 4 (10−6/°C) in the \100] direction were measured.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 302: Symposium F – Semiconductors for Room-Temperature Radiation Detector Applications , 1993 , 153
Copyright
Copyright © Materials Research Society 1993

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Footnotes

*

This work was performed under the auspices of the U.S. Department of Energy under Contract No. DE-AC08-88-NV10617. Note: By acceptance of this article, the publisher and/or recipient acknowledges the U.S. Government's right to retain a nonexclusive royalty-free license in and to any copyright covering this paper. Reference to a company or product name does not imply approval or recommendation of the product by the U.S. Department of Energy to the exclusion of others that may be suitable.

References

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