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Vanadium Doped Nanostructured TiO2 Dielectrics

Published online by Cambridge University Press:  10 March 2014

Fatih Dogan ,
Sheng Chao ,
Jing Peng  and
Steve G. Greenbaum
Fatih Dogan
Affiliation:
Department of Materials Science and Engineering, Missouri University of Science and Technology, Rolla, MO 65401, U.S.A
Sheng Chao
Affiliation:
Department of Materials Science and Engineering, Missouri University of Science and Technology, Rolla, MO 65401, U.S.A
Jing Peng
Affiliation:
Department of Physics, Hunter College of CUNY, New York, NY 10065, U.S.A.
Steve G. Greenbaum
Affiliation:
Department of Physics, Hunter College of CUNY, New York, NY 10065, U.S.A.
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Abstract

Dielectric properties of titanium oxide ceramics are strongly influenced by the microstructural features and concentration of dopants and impurity ions. Electrical conductivity (via insulation resistance) of vanadium doped nanostructured titanium dioxide (TiO2) ceramics was measured as a function of donor concentration and temperature. In order to further clarify the effect of the dopants on the microstructural development and resultant dielectric properties of TiO2, electron paramagnetic resonance (EPR) spectroscopy was employed. Vanadium-doped TiO2 exhibited well-defined hyperfine splitting characteristics of the 51V nuclei indicating that the dopant ions are dispersed within the grains and not preferentially segregated at the grain boundaries.

Keywords

dielectric propertiesceramicnanostructure
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1645: Symposium EE/ZZ – Advanced Materials in Extreme Environments , 2014 , mrsf13-1645-zz07-02
Copyright
Copyright © Materials Research Society 2014 

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References

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