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Use of Room Temperature Semiconductor Detectors for the Verification of Nuclear Material in International Safeguards Recent Advances

Published online by Cambridge University Press:  21 February 2011

R. Arlt ,
D.E. Rundquist ,
D. Bot ,
P. Siffert ,
M. Richter ,
A. Khusainov ,
V. Ivanov ,
A. Chrunov ,
Y. Petuchov  and
F. Levai
...Show all authors
D.E. Rundquist
Affiliation:
International Atomic Energy Agency, Vienna, Austria
D. Bot
Affiliation:
Bot Engineering, Campbellville, Ont., Canada
M. Richter
Affiliation:
Centre de Recherches Nucleaires, Laboratoire Phase, Strasbourg, France
A. Khusainov
Affiliation:
St. Petersburg Nuclear Physics Institute, St. Petersburg, Russia
Y. Petuchov
Affiliation:
Research Institute for Radioisotope Instrument Production, Riga, Latvia
S. Desi
Affiliation:
Technical University Budapest, Hungary
M. Tarvainen
Affiliation:
Finnish Centre for Radiation and Health Safety, Helsinki, Finland
I. Ahmed
Affiliation:
Karachi Nuclear Power Plant, Karachi, Pakistan
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Abstract

In the paper the development and usage of radiation detection systems based on room temperature semiconductors are described. The detection systems are intended for use by safeguards inspectors to verify nuclear material. Because of their high intrinsic efficiency, these detectors have advantages compared to classical germanium or Nal detectors. Several measurement tasks which cannot be handled in an optimum manner by using standard detectors have been solved. The main problem in the application of room temperature semiconductor detectors is the limitation in the availability of large detector volumes.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 302: Symposium F – Semiconductors for Room-Temperature Radiation Detector Applications , 1993 , 19
Copyright
Copyright © Materials Research Society 1993

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References

Reference List

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