Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-08T08:12:51.539Z Has data issue: false hasContentIssue false

Two-dimensional modeling of organic field effect transistors

Published online by Cambridge University Press:  01 February 2011

T. Li
Affiliation:
Department of Electrical and Computer Engineering, University of Minnesota Minneapolis, MN 55455, USA
P. P. Ruden
Affiliation:
Department of Electrical and Computer Engineering, University of Minnesota Minneapolis, MN 55455, USA
I. H. Campbell
Affiliation:
Los Alamos National Laboratory Los Alamos, NM 87545, USA
D. L. Smith
Affiliation:
Los Alamos National Laboratory Los Alamos, NM 87545, USA
Get access

Abstract

We present device simulations for p-channel organic field effect transistors. The current conservation equation and Poisson's equation are solved self-consistently in two dimensions in the drift-diffusion approximation. We focus on modeling transistor structures consisting of a gate electrode, a silicon dioxide gate insulator, and a pentacene or a conjugated polymer layer as the active (channel) material. The source and drain contacts are taken to be deposited directly on the gate insulator (bottom contact structure). We examine the effects associated with differences in charge carrier injection for different source and drain contact materials. It is also shown that, if the organic material immediately adjacent to the contacts has poor conduction properties, ‘parasitic’ source and drain series resistances that depend on the contact/organic injection barrier height as well as the channel material mobility can result.

Type
Research Article
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.See for example: Katz, H.E. Dodabalapur, A. and Bao, Z. in Oligo- and Polythiophene-Based Field Effect Transistors, edited by Fichou, D. Wiley, Weinheim (1998).Google Scholar
2. Sirringhaus, H. Tessler, N. and Friend, R.H. Science 280, 1741 (1998).Google Scholar
3. Ziemelis, K. Nature 393, 619 (1998).Google Scholar
4. Schon, J.H. Berg, S. Kloc, Ch., and Batlogg, B., Science 287, 1022 (2000).Google Scholar
5. Horowitz, G. Peng, X.Z. Fichou, D. and Garnier, F. J. Appl. Phys. 67, 528 (1990).Google Scholar
6. Brown, A.R. Jarrett, C.P. Leeuw, D.M. de, and Matters, M. Synth. Met. 88, 37 (1997).Google Scholar
7. Koezuka, H. Tsumara, A. and Ando, T. Synth. Met. 18, 699 (1988).Google Scholar
8. Schon, J.H. Kloc, Ch., and Batlogg, B. Phys. Rev. B 63, 245201 (2001).Google Scholar
9. Campbell, I.H. and Smith, D.L. “Physics of organic electronic devices” in Solid State Physics, Ehrenreich, H. and Spaepen, F. eds., Academic Press, New York (2001).Google Scholar
10. Li, T. Ruden, P.P. Campbell, I.H. and Smith, D.L. to be published.Google Scholar
11. Burgi, L. Sirringhaus, H. and Friend, R.H. to appear in Appl. Phys. Lett., April (2002).Google Scholar
12. Tessler, N. and Roichman, Y. Appl. Phys. Lett. 79, 2987 (2001).Google Scholar