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Transmission Electron Microscopy and X-Ray Diffraction Studies of a,b-Axis Oriented YBa2Cu3O7-δ Films

Published online by Cambridge University Press:  26 February 2011

S. K. Streiffer ,
B. M. Lairson ,
E. M. Zielinski  and
J. C. Bravman
S. K. Streiffer
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA. 94305
B. M. Lairson
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA. 94305
E. M. Zielinski
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA. 94305
J. C. Bravman
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA. 94305
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Abstract

Quantitative high resolution transmission electron microscopy and x-ray diffraction have been used to study films of YBa2Cu3O7-δ grown on LaAlO3 substrates at low substrate temperatures. Based on analysis of high-resolution micrographs, it is asserted that the films are b-axis oriented near the film-substrate interface, and switch to a-axis oriented at some distance away from the interface, in a manner which varies from sample to sample. Thus, the films undergo a change in orientation as a function of distance from the substrate. X-ray diffraction confirms that these films contain both a-axis oriented and b-axis oriented components normal to the plane of the substrate, consistent with the high-resolution microscopy data.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 275: Symposium S – Layered Superconductors: Fabrication, Properties and Applications , 1992 , 771
Copyright
Copyright © Materials Research Society 1992

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References

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