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Studies of Metallic Species Incorporation During Growth of SrBi2Ta2O9 Films on YBa2Cu3O7−x Substrates Using Mass Spectroscopy of Recoiled Ions

Published online by Cambridge University Press:  10 February 2011

A.M. Dhote ,
A.R. Krauss ,
O. Auciello ,
J. Im ,
D.M. Gruen ,
R. Ramesh ,
S.P. Pai  and
T. Venkatesan
A.M. Dhote
Affiliation:
Materials Science and Chemistry Divisions, Argonne National Laboratory, Argonne, IL60439 Materials and Nuclear Engineering Department, University of Maryland, College Park, MD 20742
A.R. Krauss
Affiliation:
Materials Science and Chemistry Divisions, Argonne National Laboratory, Argonne, IL60439
O. Auciello
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL60439
J. Im
Affiliation:
Materials Science and Chemistry Divisions, Argonne National Laboratory, Argonne, IL60439
D.M. Gruen
Affiliation:
Materials Science and Chemistry Divisions, Argonne National Laboratory, Argonne, IL60439
R. Ramesh
Affiliation:
Materials and Nuclear Engineering Department, University of Maryland, College Park, MD 20742
S.P. Pai
Affiliation:
Center for Superconductivity Research, Department of Physics, University of Maryland, College Park, MD 20742
T. Venkatesan
Affiliation:
Center for Superconductivity Research, Department of Physics, University of Maryland, College Park, MD 20742
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Abstract

The incorporation of metallic species (Bi, Sr and Ta) during the growth of layered perovskite SrBi2Ta2O9 (SBT) on a-axis oriented YBa2Cu3O7−x (YBCO) conducting oxide substrates has been investigated using in situ low energy mass spectroscopy of recoiled ions (MSRI). This technique is capable of providing monolayer-specific surface information relevant to the growth of single and multi-component thin films and layered heterostructures. The data show a temperature dependence of metallic species incorporation during co-deposition of Sr, Bi and Ta on YBCO surfaces. At high temperatures (400 < T ≤ 700°C), negligible incorporation of Bi is observed as compared to Ta and Sr. At low temperatures (≤ 400°C), there is a substantial incorporation of Bi, Sr and Ta on the surface of YBCO, and the MSRI signal intensities for Sr, Bi and Ta are nearly independent of substrate temperature. According to thermodynamic calculations, the presence of Ba and Y on the YBCO surface inhibit the incorporation of Bi due to competition for oxygen required to establish bonding of metallic species to the surface. This may be the explanation for the observed Bi deficiency in films grown on YBCO surfaces at temperatures > 400°C. SBT films grown at temperatures ≤ 400°C and annealed in oxygen or air at 800°C exhibit a polycrystalline structure with partial a-axis orientation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 541: Symposium O – Ferroelectric Thin Films VII , 1998 , 281
Copyright
Copyright © Materials Research Society 1999

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References

REFERENCES

1. Scott, J.F., Ross, F.M., Araujo, C.A. Pazde, Scott, M.C., and Huffman, M., MRS Bull. 21, 33 (1996).Google Scholar
2. Auciello, O., Ramesh, R., and Dat, R. in Ferroelectric Thin Films:Synthesis and Basic Properties, edited by Araujo, C.A. Pazde, Scott, J.F. and Tylor, G.W. (Gordon and Breach, New York, 1996), p 525.Google Scholar
3. MRS Bull. 22 & 23 (1996), edited by Auciello, O. and Ramesh, R..Google Scholar
4. Cummins, S.E., and Cross, L.E., J. Appl. Phys. 39, 2268 (1968).Google Scholar
5. Im, J., Auciello, O., Krauss, A.R., Dhote, A.M., Gruen, D.M., Ramesh, R. and Chang, R.P.H., Appl. Phys. Lett. 72, 2529 (1998).Google Scholar
6. Krauss, A.R., Lin, Y., Auciello, O., Lamich, G.J., Gruen, D.M., Schultz, J.A., and Chang, R.P.H., J. Vac. Sci. Technol. A 12, 1943 (1994).Google Scholar
7. Krauss, A.R., Auciello, O., Shultz, J.A., MRS Bull. 20, 18 (1995).Google Scholar
8 Handbook of chemistry and Physics, Weast, R.C. and Tuve, G.L., Eds., 52nd Ed., The Chemical Rubber Publishing Co., Ohio, 1971.Google Scholar
9. Michaelis, A., Irene, E.A., Auciello, O., and Krauss, A.R., J. Appl. Phys. 83, 7736 (1998).Google Scholar
10. Lee, J.K., Song, T.K., and Jung, H.J., Integrated Ferroelectrics 15, 115 (1997).Google Scholar