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Structural Characterization of Cu2+ Functional Centers In ‘Lead-Free’ KNN Piezoelectrics

Published online by Cambridge University Press:  31 January 2011

Ebru Erünal ,
Rüdiger-A. Eichel ,
Jerome Acker ,
Hans Kungl  and
Michael J. Hoffmann
Ebru Erünal
Affiliation:
[email protected]
Rüdiger-A. Eichel
Affiliation:
[email protected], University of Freiburg, Institute of Physical Chemistry, Freiburg, Germany
Jerome Acker
Affiliation:
[email protected], University of Karlsruhe, Institute of Ceramics in Mechanical Engineering, Karlsruhe, Germany
Hans Kungl
Affiliation:
[email protected], University of Karlsruhe, Institute of Ceramics in Mechanical Engineering, Karlsruhe, Germany
Michael J. Hoffmann
Affiliation:
[email protected], University of Karlsruhe, Institute of Ceramics in Mechanical Engineering, Karlsruhe, Germany
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Abstract

The alkali niobate ferroelectrics ((K0.5Na0.5)NbO3, KNN) are promising candidates as alternatives for PZT (Pb(ZrxTi(1-x))O3) ceramics in piezoelectric technologies. In order to obtain dense compounds with desirable properties, CuO has been used as sintering aid. In this work, the defect chemistry of Cu2+ doped KNN was investigated by means of electron paramagnetic resonance (EPR). Copper is found to be incorporated as acceptor-type centers on B-site in the perovskite structure and, due to charge compensation, two kinds of mutually compensating defect dipoles are formed.

Keywords

piezoelectricdefectsdopant
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1199: Symposium F –Multiferroic and Ferroelectric Materials , 2009 , 1199-F03-32
Copyright
Copyright © Materials Research Society 2010

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References

[1] Rödel, J., Jo, W., Seifert, K. T. P., Anton, E.-M., Granzow, T., Damjanovic, D., J. Am. Ceram. Soc. 92 [6], 1153 (2009).Google Scholar
[2] Nordberg, G., Fowler, B. A., Nordberg, M., Friberg, L., Handbook on the Toxicology of Metals, Elsevier Science Publishers, New York, 117 (1986).Google Scholar
[3] Jaffe, B., Cook, W. R., and Jaffe, H., Piezoelectric Ceramics, Academic Press, New York, 115–181 (1971).Google Scholar
[4] Shirane, G., Newnham, R., Pepinsky, R., Phys. Rev. 96, 581, (1954).Google Scholar
[5] Maeder, D.M., Damjanovic, D., Lead Free Ferroelectric Materials, in Setter, N. (ed.) Piezoelectric Materials in Devices, Lausanne, 389 (2002).Google Scholar
[6] Shrout, T.R., Zhang, S.J., J. Electroceram. 19, 111, (2007).Google Scholar
[7] Malic, B., Jenko, D., Bernard, J., Cilensek, J., Kosec, M., Mater. Res. Soc. Symp. Proc. 755, 83 (2003).Google Scholar
[8] Kleebe, H.J., Lauterbach, S., Silvestroni, L., Kungl, H., Hoffmann, M. J., Erdem, E., Eichel, R.-A., Appl. Phys. Lett. 94, 142901 (2009).Google Scholar
[9] Matsubara, M., Yamaguchi, T., Kikuta, K., Hirano, S., Jpn. J. Appl. Phys. 43, 7159 (2004).Google Scholar
[10] Lin, D., Kwok, K.W., Chan, H.L.W., J. Phys. D: Appl. Phys 41, 045401, (2008).Google Scholar
[11] Ahn, C.W., Karmarkar, M., Viehland, D., Kang, D.H., Bae, K.S., Priya, S., Ferroel. Lett. 35, 66 (2008).Google Scholar
[12] Lv, Y.G., Wang, C.L., Zhang, J.L., Zhao, M.L., Li, M.K., Wang, H.C., Mat. Lett. 62, 3425 (2008).Google Scholar
[13] Wada, S., Seike, A., Tsurumi, T., Jpn. J. Appl. Phys. 40, 5690, (2001).Google Scholar
[14] Nakamura, K., Tokiwa, T., Kawamura, Y., J. Appl. Phys. 91, 9272, (2002).Google Scholar
[15] Matsubara, M., Yamaguchi, T., Sakamoto, W., Kikuta, K., Yogo, T., Hirano, S., J. Am. Ceram. Soc. 88, 1190, (2005).Google Scholar
[16] Park, H.Y., Choi, J.Y., Choi, M.K., Cho, K.H., Nahm, S., J. Am. Ceram. Soc. 91, 2364, (2008).Google Scholar
[17] Li, E., Kakemoto, H., Hoshina, T., Tsurumi, T., Jpn. J. Appl. Phys. 47, 7702, (2008).Google Scholar
[18] Acker, J., Kungl, H., Hoffmann, M.J., J. Am. Ceram. Soc. 93[5], 1270 (2010).Google Scholar
[19] Stoll, S., Schweiger, A., J. Magn. Reson. 178, 42, (2006).Google Scholar
[21] Eichel, R.-A., J. Electroceram. 19, 9, (2007).Google Scholar
[22] Eichel, R.-A., J. Am. Ceram. Soc. 91, 691, (2008).Google Scholar
[20] Eichel, R.-A., Drahus, M. D., Jakes, P.; Erünal, E., Erdem, E., Parashar, S. K.S., Kungl, H., Hoffmann, M. J., Mol. Phys. 107 [19], 1981 (2009).Google Scholar
[23] Eichel, R.-A., Erünal, E., Drahus, M. D., Smyth, D. M., Tol, J. van, Acker, J., Kungl, H., Hoffmann, M. J., Phys. Chem. Chem. Phys. 11, 8698 (2009).Google Scholar
[24] Erunal, E., Eichel, R.-A., Körbel, S., Elsässer, C., Acker, J., Kungl, H., Hoffmann, M.J., Funct. Mater. Lett. 3 [1], 19 (2010).Google Scholar