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Stereochemical Structure for Sodium in Native and Thermal Silica Layers

Published online by Cambridge University Press:  10 February 2011

A.-M. Flank
Affiliation:
LURE, Bât 209D, B.P. 34, Centre Universitaire Paris-Sud, F-91898 Orsay Cedex
F. Tenegal
Affiliation:
LURE, Bât 209D, B.P. 34, Centre Universitaire Paris-Sud, F-91898 Orsay Cedex
P. Lagarde
Affiliation:
LURE, Bât 209D, B.P. 34, Centre Universitaire Paris-Sud, F-91898 Orsay Cedex
C. Mazzara
Affiliation:
Laboratoire CNRS/Saint-Gobain “Surface du Verre et Interfaces”, BP 135, F-93303 Aubervilliers, France
J. Jupille
Affiliation:
Laboratoire CNRS/Saint-Gobain “Surface du Verre et Interfaces”, BP 135, F-93303 Aubervilliers, France
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Abstract

Sodium-covered silica films formed on silicon substrates have been examined by X-ray photoemission spectroscopy (XPS) and X-ray absorption spectroscopy (EXAFS) in ultra-high vacuumconditions at 300K. The results show that sodium diffuses into the silica layer on a reversible manner and that it modifies the silica network in order to create its own site. Sodium atoms are surrounded by oxygen atoms at an average distance of 2.3 Å and by a second shell which is assigned to silicon atoms located at 3.8 Å. At high Na concentrations, sodium atoms are also present in the close environment of one sodium atom.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

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